ISSN:
1551-2916
Source:
Blackwell Publishing Journal Backfiles 1879-2005
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
A new microfocus X-ray testing method has been developed to detect very small defects in ceramic products with high speed and reliability. By using image subtraction, enhanced X-ray images of defects were extracted from the background noise. Much-better sensitivity (e.g., 0.1% in Si3N4 that was 20 mm thick) was obtained within a few minutes. This method is considerably superior to the conventional film method. In this study, Si3N4 test pieces (penetrameters) that had very small artificial defects (such as slits and pores) were prepared and examined by using the new method.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1111/j.1151-2916.1999.tb01849.x
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