Electronic Resource
Chichester [u.a.]
:
Wiley-Blackwell
Surface and Interface Analysis
24 (1996), S. 263-270
ISSN:
0142-2421
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
The chemical composition of thin segregation layers is calculated using elemental Auger spectra and considering the adsorption of residual gas components during analysis. We take into account that the coverage with oxygen is different for the different elements in the thin layer and that the shape of the Auger peaks is changed by the coverage. Application of the method is demonstrated for quantitative analysis ofin situfractured grain boundaries of B-doped Ni3Al bicrystals.
Additional Material:
8 Ill.
Type of Medium:
Electronic Resource
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