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  • 1
    Electronic Resource
    Electronic Resource
    The spectral forms of transient ESR spectra of radical pairs and the origin of the antiphase structure (2000)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 113 (2000), S. 1595-1604 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: We show that transient electron spin resonance (ESR) spectra of short lived radical pairs can be written formally as a superposition of Lorentzian-like lines and the corresponding dispersive lines. The coefficients to these spectral components depend strongly on the frequency and amplitude of the microwave (mw) field and consequently a variety of spectral forms may result. The coefficients, and thus the spectral form, are determined by the interradical interaction induced rate of change of the longitudinal and transversal electron spin polarization. The longitudinal polarization is responsible for the well known chemically induced dynamic electron polarization (CIDEP) which changes the intensity of the lines without affecting the line shape. The transversal polarization is shown to be responsible for the antiphase structure (APS) in accordance with our previous proposition [J. Chem. Phys. 109, 8743 (1998)]. A simple one re-encounter model calculation illustrates and explains qualitatively most of the observed APS characteristics. Numerical calculations are used to discuss anomalously large APS splitting. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.481947
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  • 2
    Electronic Resource
    Electronic Resource
    On the mechanism of antiphase electron spin resonance spectra of radical pairs (1998)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 109 (1998), S. 8743-8746 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: We have investigated the origin of the antiphase structure of the mw-induced ESR spectrum of a radical pair in a micelle. By applying an accurate numerical method we have examined various specially designed cases that clearly distinguish between the proposed mechanisms for the production of antiphase structure. It is demonstrated that neither of the previously proposed mechanisms can explain the observations. We argue that the only possible mechanism is a coherent, reencounter type mechanism involving two consecutive steps similar to the well established S–T0 mechanism. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.477541
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  • 3
    Electronic Resource
    Electronic Resource
    Accuracy in measurement of gas partial pressure in biological media by gas-consuming probes (1988)
    Springer
    Medical & biological engineering & computing 26 (1988), S. 203-206 
    Details
    ISSN: 1741-0444
    Keywords: Depletion layer ; Gas-consuming sensor ; Measurement accuracy ; Partial pressure ; Reference gas method
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology , Chemistry and Pharmacology , Medicine
    Notes: Abstract The accuracy by which gas partial pressures can be measured by membrane-covered gas-consuming probes is investigated. It is shown that the signal depends on the size and shape of the sample. A theoretical estimate of the maximum scatter due to variations in the sample geometry agrees well with the scatter observed in experiments and may thus be used as a measure of the obtainable experimental accuracy. The so-called reference gas method is shown to be useful if the product of the diffusion and solubility coefficients is similar for the two gases, which is the case for O2 and Ar, but not for CO2 and Ar.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF02442265
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  • 4
    Electronic Resource
    Electronic Resource
    Analytical background correction in numerical Fourier transform procedures. Application to electron spectroscopy (1995)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 23 (1995), S. 717-722 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An analytical correction method is proposed to eliminate the problems resulting from numerical Fourier transformation of functions with a broad background. The method incorporates the analytically known or observed asymptotic behaviour into the numerical procedure. The applicability and high accuracy of the background correction method is illustrated by application to the analysis of reflected electron energy-loss spectra.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740231011
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  • 5
    Electronic Resource
    Electronic Resource
    Estimation of depth profiles from inelastic backgrounds in XPS. I. General relationships (1995)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 23 (1995), S. 753-763 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The accuracy by which an unknown concentration profile can be found by analysis of XPS spectra is investigated theoretically by analytical and numerical techniques. The problem of determining the profile is reformulated as an optimization problem. By use of analytical techniques we obtain qualitative statements about the depth resolution and we derive fundamental relationships between the different parameters that indicate their relative importance. In order to illustrate the various dependencies of the variability of the model parameters, we derive analytical expressions for the standard errors of the model parameters for two simple models: a dalta layer and an exponentially decreasing profile. Furthermore, the complete probability distribution of the model parameters for a rectangular model is investigated numerically.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740231104
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