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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 53 (1988), S. 2377-2379 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new formula is presented for the etch depth l per pulse of an excimer laser of fluence F. Incremental ablation is defined as the etch depth per pulse after many pulses. We show that l is proportional to F, rather than ln(F).
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 57 (1985), S. 5512-5518 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The previously postulated production of holes during the electrical breakdown of varistors has been directly verified. In some compositions band-gap (3.2 eV) luminescence from the recombination of these holes with free electrons has been observed. The intensity of this luminescence is greater in varistor compositions exhibiting higher nonlinearity coefficients. It is also proportional to the square of the current which implies hole creation by impact ionization in the depletion region near the grain boundaries. This study used varistors of relatively simple chemical composition.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 61 (1987), S. 2571-2574 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The spatial density and energy distribution of grain boundary electronic states were measured in Bi-Co-ZnO and Pr-Co-Al-ZnO varistors. A large density of trap states was observed 0.6 to 0.7 eV below the conduction-band edge in both compositions. The physical origin of these states is extrinsic and may be attributed to Bi or Pr ions in the boundaries.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Stamford, Conn. [u.a.] : Wiley-Blackwell
    Polymer Engineering and Science 29 (1989), S. 1574-1578 
    ISSN: 0032-3888
    Keywords: Chemistry ; Chemical Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: The optical properties of polyetherimide resin as described by the complex index of refraction, N = n - ik, are derived by Kramers-Kronig analysis of experimental absorption and reflectance data obtained in the range 40 μm ≥ λ ≥105 nm. Potential uses of this polymer as a printed circuit board material and as a packaging medium for microelectronic circuitry and the relevance of optical data in laser-assisted processing schemes used in these and other applications are briefly discussed.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Stamford, Conn. [u.a.] : Wiley-Blackwell
    Polymer Engineering and Science 27 (1987), S. 1148-1155 
    ISSN: 0032-3888
    Keywords: Chemistry ; Chemical Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: The optical properties of bisphenol-A polycarbonate resin as described by the complex index of refraction, N = n - ik, are derived by Kramers-Kronig analysis of experimental absorption and reflectance data obtained in the range 40μm ≥ λ ≥ 105 nm. Electronic absorption processes in polycarbonate are characterized by two broad absorption peaks centered at ∼200 and ∼100 nm.
    Additional Material: 10 Ill.
    Type of Medium: Electronic Resource
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