Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
30 (1997), S. 905-908
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
A new experimental set-up is described that allows the measurement of the X-ray reflectivity of thin layers that are contained in a growth chamber (in situ). The X-ray reflectivity measured with our angular dispersive glancing incidence reflectometer is identical, within experimental error, to that measured with a conventional high-resolution diffractometer.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889897002483
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