ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
In this paper a method for disentangling the various noise components in semiconductor radiation detector–amplifier systems is described and experimentally tested. A charge amplification scheme is adopted for the measurements. It is shown how an accurate estimate of the series and parallel white noise, 1/f series noise, and f parallel noise can be quickly obtained through a multiparameter least-squares interpolation of the equivalent noise charge data of the system.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1144293
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