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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 73 (2002), S. 1668-1670 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The piezo-x-ray absorption spectroscopy technique is a novel tool for time-resolved x-ray absorption spectroscopy in the hard x-ray range. It makes use of piezo tilt tables mounted below the crystals in a double crystal or channel cut crystal monochromator. Repetitive energy scans are performed by applying an oscillatory high voltage to the piezo translators of the tilt tables. Currently, this allows one to scan an energy range of several hundred eV in the hard x-ray range with repetition frequencies of typically 10 Hz. The capability to record full extended x-ray absorption fine structure spectra on a subsecond time scale is demonstrated. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new bending mechanism for an indirectly water cooled monochromator crystal has been developed. The main design goals were a lightweight construction, ease of manufacture, and control. The construction consists of a U-shaped first Si(111) crystal, which can be bent by compressed air to compensate the bowing induced by the heat load from the impinging white synchrotron radiation. The performance of the system was tested at the x-ray undulator beamline BW1 at HASYLAB (Hamburg, Germany). For heat loads between ∼100 and 400 W, rebending of the crystal significantly increases the intensity of the monochromatic beam while the rocking curve is narrowed accordingly, typical widths obtained at 8.9 keV photon energy amount to about 10 arc sec. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 8 (2001), S. 354-356 
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The Piezo-QEXAFS technique is a novel tool for time-resolved X-ray absorption spectroscopy in the hard X-ray range. Monochromator components consisting of specialized tilt stages to perform fast energy scans, lightweight crystal holders, bending mechanics, and control electronics are being installed and commissioned. It is planned to perform fast EXAFS scans with time resolution in the millisecond range. With Piezo-QEXAFS all typical X-ray absorption experiments will be possible as it retains the standard linear geometry. The achieved time resolution opens interesting insights into the dynamics of phase transitions and chemical reactions.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 6 (1999), S. 1153-1167 
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The manufacture and properties of compound refractive lenses (CRLs) for hard X-rays with parabolic profile are described. These novel lenses can be used up to ∼60 keV. A typical focal length is 1 m. They have a geometrical aperture of 1 mm and are best adapted to undulator beams at synchrotron radiation sources. The transmission ranges from a few % in aluminium CRLs up to about 30% expected in beryllium CRLs. The gain (ratio of the intensity in the focal spot relative to the intensity behind a pinhole of equal size) is larger than 100 for aluminium and larger than 1000 for beryllium CRLs. Due to their parabolic profile they are free of spherical aberration and are genuine imaging devices. The theory for imaging an X-ray source and an object illuminated by it has been developed, including the effects of attenuation (photoabsorption and Compton scattering) and of the roughness at the lens surface. Excellent agreement between theory and experiment has been found. With aluminium CRLs a lateral resolution in imaging of 0.3 µm has been achieved and a resolution below 0.1 µm can be expected for beryllium CRLs. The main fields of application of the refractive X-ray lenses are (i) microanalysis with a beam in the micrometre range for diffraction, fluorescence, absorption, scattering; (ii) imaging in absorption and phase contrast of opaque objects which cannot tolerate sample preparation; (iii) coherent X-ray scattering.
    Type of Medium: Electronic Resource
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