ISSN:
1063-7826
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Notes:
Abstract The kinetics of structural relaxation in hydrogenated amorphous silicon (a-Si:H) deposited by various methods is investigated by differential scanning calorimetry. The experimental results are used to analyze the nature of the metastable states in a-Si:H and to investigate the relationship between structural relaxation and light-induced metastability (the Staebler-Wronski effect).
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1134/1.1187306
Permalink