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  • 1
    ISSN: 1551-2916
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: The nanotribological properties of nanostructured thin films of tetragonal ZrO2 on oxidized Si (100) were studied as a function of grain size and relative humidity (RH) by atomic force microscopy. The nanostructured ZrO2 showed a 50% decrease in friction coefficient μ compared with oxidized Si (100) in dry nitrogen atmosphere and 40% RH. A maximum of μ was observed at ca. 40% RH for both samples, while there were insignificant differences in μ for ZrO2 samples with grain sizes between 12 and 30 nm. The good tribological properties open the possibility for nanostructured zirconia to be applied as wear-resistant, low friction coatings on various materials.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1436-2449
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Summary The spherulitic morphology of isotactic polypropylene (i-PP) was investigated by a combination of optical and atomic force microscopes. Thin films of i-PP were prepared in situ by using a hot stage. The crystallization conditions were carefully selected to produce different types of spherulites including α-I, α-II, mixed, and β-III types. Atomic force microscopy (AFM) scans unveiled morphological details such as mother/daughter lamellae, cross-hatching, and thickness and orientation of the lamellae. In a few cases, macromolecules were visualized. However, due to poor resolution, only the expected chain direction within the lamellae could be determined. The advantages and disadvantages of using AFM to study the surface of spherulites is discussed.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Bognor Regis [u.a.] : Wiley-Blackwell
    Journal of Polymer Science Part B: Polymer Physics 36 (1998), S. 2483-2492 
    ISSN: 0887-6266
    Keywords: low-density polyethylene ; surface modification of polymers ; scanning force microscopy ; self-assembled monolayer of thiols ; chemical force microscopy ; Physics ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Notes: In this article, we present the results of a study on the surface properties of chromic acid-oxidized low-density polyethylene (LDPE) by scanning force microscopy (SFM) and contact angle measurements. LDPE films were surface modified by a chromic acid treatment with subsequent annealing in argon and reconstruction in boiling water as described by Rasmussen, Stedronsky, and Whitesides [J. Am. Chem. Soc., 99, 4736 (1977)]. The LDPE oxidation in chromic acid was monitored in situ by contact mode SFM. Initially stacks of lamellae became exposed, and at later stages a granular morphology was observed. By tapping mode SFM, the sample roughness was shown to increase during the first 10 min of oxidation from initially ca. 20 nm to ca. 50 nm. Gold-coated SFM probes (tips) functionalized with self-assembled monolayers were used to determine the pull-off force characteristics in ethanol. Variations in the contact area between SFM tips and polymer surfaces that exposed sharp crystalline features were shown to obscure the results of pull-off force measurements. However, on annealed and subsequently reconstructed samples with lower roughness, the results of force measurements correlated well with the measured contact angles. Over the range of surface energies studied, the normalized pull-off force between carboxylic acid-modified tips and these smooth samples was shown to depend approximately linearly on the cosine of the contact angle. © 1998 John Wiley & Sons, Inc. J. Polym. Sci. B Polym. Phys. 36: 2483-2492, 1998
    Additional Material: 10 Ill.
    Type of Medium: Electronic Resource
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