Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
13 (1980), S. 50-57
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
Defects are studied in natural quartz crystals by X-ray diffraction topography with a Lang camera. Dislocations, precipitates and band growths revealed by X-ray studies are also characterized by other methods such as optical microscopy and thermoluminescence. Finally, a model of growth is proposed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889880011491
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