Library

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Electronic Resource
    Electronic Resource
    Nanometer-scale imaging with an ultrafast scanning tunneling microscope (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 504-506 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present experimental data demonstrating the spatial resolution of an ultrafast junction mixing scanning tunneling microscope (JM-STM). The experiment uses a patterned metal-on-metal (Ti/Au) surface to establish electronic structure contrast on a short length scale. Our measurements achieve a spatio-temporal resolution of 20 nm–20 ps, limited only by the sample properties. The fine spatial resolution proves that the time-resolved signal is generated in the tunnel junction, indicating that atomic resolution should be possible in the JM-STM mode of operation. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.120798
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Advances in picosecond scanning tunneling microscopy via junction mixing (1997)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 70 (1997), S. 1909-1911 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ten picosecond resolution in stroboscopic scanning tunneling microscopy of repetitive phenomena has been demonstrated using tunnel junction mixing. This represents an order-of-magnitude improvement over earlier work. Through relative timing of the tunneling current signal as a function of tip position along a transmission line, additional confirmation of time-resolved signal generation at the tunnel junction has also been established. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.118727
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Noise imaging in stroboscopic ultrafast microscopy (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 717-719 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We describe a method for studying the presence of stochastic sample behavior within stroboscopically averaged time-resolved imaging experiments. The technique is based upon continuous noise analysis concurrent with signal acquisition. An example is presented in which details of random magnetic switching are exposed in a time-resolved scanning Kerr microscopy measurement. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.127096
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...