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  • 1
    Electronic Resource
    Electronic Resource
    Phase shift nonlinearity at resonance in a piezofilm-based fiber-optic phase modulator (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 1975-1980 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The PVF2 film-based fiber-optic phase modulator exhibits a resonance around 3.5 kHz. Existing reports of its characterization have considered only the linearity at nonresonance frequencies and the frequency response at a single drive voltage. A large nonlinearity of phase shift with applied voltage at frequencies near the resonance has been measured. The factors that influence the resonance have been identified on the basis of the frequency response for different drive voltages. These measurements were facilitated by the three new methods of phase detection we recently reported.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.346596
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Measurement of dynamic polarization modulation depth utilizing the J1–J4 method of spectrum analysis (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 2337-2343 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A spectrum analysis method for the linear, direct, and self-consistent measurement of dynamic modulation depth of polarization modulators is presented. This method utilizes the Bessel recurrence relation to determine the modulation depth from the photodetector voltage amplitudes at the fundamental frequency and its next three harmonics. Based on the existing J1–J4 method of dynamic phase-shift measurement in homodyne interferometry, this method is useful for calibration of polarization modulated ellipsometers. The method is demonstrated through the use of a highly birefringent transparent thin film of piezoelectric polyvinylidene fluoride with indium tin oxide electrodes. The theoretical analysis of the measured noise factor for the particular system configuration predicted a minimum detectable polarization modulation depth of 0.2 rad, and was experimentally verified.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144685
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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