ISSN:
0142-2421
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
Fast atom bombardment mass spectrometry permits the detection of secondary ions from surfaces of insulator materials without the necessity for charge neutralization of the surface by electron bombardment. It thus opens the possibility of routine mass spectral analysis of surfaces yielding data concerning not only their elemental composition but also their chemical structure. The possibilities are illustrated from examples of the analysis of glass and catalyst surfaces.
Additional Material:
15 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/sia.740040407
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