ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A detector setup with three LN-cooled Si(Li) diodes is used to measure soft x-ray spectra (0.8–20 keV) emitted from the inside walls of the PDX vessel during the plasma discharge. The setup is part of a pulse-height-analysis system, which is used to measure the plasma and wall radiation simultaneously at five different radial positions. The wall and the plasma radiation are measured under different plasma conditions (e.g., OH and neutral beam heating). The wall radiation is very much increased during the neutral beam heating, with an enhancement factor of at least 10 over the OH wall radiation. Since we measure the plasma and the wall radiation at the same time, the measurements allow the conclusion that the wall radiation can be attributed essentially to fluorescence (line radiation, e.g., Ti-Kα) and scattering (continuum part of the wall radiation spectrum). The fluorescence and the scattering are both caused by soft x-ray radiation flux coming from the plasma. There seems to be no need to invoke other, more exotic causes for the wall radiation, for example, charge particle bombardment of the wall.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1138022
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