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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 59 (1988), S. 1869-1871 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Co- and counter-viewing bolometers aimed along a common tangency chord are being used to study power losses due to charge exchange (CX) of fast ions in neutral beam injection (NBI) heated TFTR plasmas. For unidirectional injection, tangential bolometers oriented to view CX loss of circulating fast ions detect losses from the thermal target plasma (impurity radiation and CX) plus power due to the fast ion CX loss, whereas bolometers oppositely directed measure only the target plasma contribution. The difference between the two signals is a measure of the fast ion CX loss. Additional information is obtained by comparing the tangential bolometer signals with those of perpendicularly viewing bolometer monitors and arrays. The measurements are compared to results of the TRANSP code analysis.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 4750-4752 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: This paper describes the program snapin which is used to prepare data for transport analysis with the snap code. The data input to snap includes diagnostic profiles [ne(R), Te(R), Ti(R), vφ(R), Zeff(R), Prad(R)] and measurements such as total plasma current, Rmajor, beam power, gas puff rate, etc. snapin reads in the necessary TFTR data, allows editing of that data, including graphical editing of profile data and the selection of physics models. snapin allows comparison of profile data from all diagnostics that measure a quantity, for example, electron temperature profiles from Thomson scattering and electron cyclotron emission (ECE). A powerful user interface is important to help the user prepare input data sets quickly and consistently, because hundreds of variables must be specified for each analysis. snapin facilitates this by a careful organization of menus, display of all scalar data and switch settings within the menus, the graphical editing and comparison of profiles, and step-by-step checking for consistent physics controls [J. Murphy, S. Scott, and H. Towner, The snap User's Guide, Technical Report PPPL-TM-393, Princeton Plasma Physics Laboratory (1992)].
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: This paper describes the between shots data analysis on TFTR using the one-dimensional equilibrium kinetic analysis code SNAP. SNAP accepts as input data: the measured plasma size and current, toroidal field, surface voltage, plasma composition (total Zeff and Zeff contribution from metallic impurities), edge neutral density, auxiliary heating power data (neutral beam power, energy, injection geometry and/or rf power and frequency), and measured profiles of Te(R), ne(R), Ti(R), Vφ(R), and Prad(R). SNAP iteratively calculates: (1) the mapping of profile data to a minor radius grid, (2) the magnetic topology including Shafranov shifted circular flux surfaces, (3) neutral beam attenuation and deposition profiles, (4) unthermalized beam ion density and beam power density delivered to thermal plasma species from a numerical solution to the Fokker–Planck equation, (5) the neutral density profile, (6) local heat and particle transport coefficients consistent with the measured profiles and calculated source terms, (7) ICRF power profiles from a reduced order full wave analysis and isotropic Stix quasilinear model, and (8) total neutron emissivity and plasma stored energy. Several ion heat transport models (including neoclassical χi and χi∝χe) are available to calculate an expected Ti(r) profile in the absence of measurements.
    Type of Medium: Electronic Resource
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