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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 90 (2001), S. 6287-6296 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The impact of water on the hydroxyl-terminated perfluoropolyether, Zdol, and the amorphous carbon overcoats commonly used on magnetic recording disks was investigated via computer modeling, kinetic experiments, and surface energy measurements. Water is shown to interact via hydrogen bonding with the hydroxyl end groups of Zdol and the polar, carbon–oxygen functionalities on the carbon overcoat. The interaction between water and the hydrophobic perfluorinated backbone is, however, repulsive. The corrosion susceptibility of Zdol lubricated magnetic recording disks was also studied. Reduced levels of corrosion were observed when the total Zdol thickness, and/or the bonded thickness, were increased. The results are consistent with a heterogeneous corrosion mechanism in which electron transfer from the polar functionalities on the carbon overcoat to the surface adsorbed water is the rate limiting step. The disk lubricant inhibits the electrochemical conductivity of the disk surface by; (a) a screening of the electrochemically active surface sites by the hydrophobic perfluoropolyether backbone, and (b) a neutralization of the surface active sites by hydrogen bonding of the hydroxyl end groups of Zdol. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 5378-5380 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Solid fluorocarbon films were deposited on carbon overcoated magnetic recording media. The films were made by direct ion beam deposition of fluorocarbon monomers. This paper presents ellipsometric measurements on films over a range of thickness from 0.5 to 12.5 nm. Film thickness was measured using ellipsometry, and the chemical composition was studied using x-ray photoelectron spectroscopy (XPS). A high-speed ellipsometer was set up to map thickness over the whole media surface. The ellipsometric angle Δ was found to be linearly related with the film thickness. Since the escape depth of the XPS is comparable to the film thickness, the XPS senses the underlying carbon as well as the carbon in the film. As a result, the apparent ratio of fluorine to carbon depends on the film thickness. The ion beam deposition technique can be used to produce films with controlled thickness and uniform composition. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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