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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 3600-3604 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We investigate the possibility of constructing nanostructure waveguides using Si-based materials. For this purpose we evaluate the dielectric function of strain-symmetrized (Si)10−n/(Ge)n strained-layer superlattices (SLS's) with n=3, 5 and 7, and (Si)6/(Ge)4 SLS coherently grown on a Si(001) surface, as well as that for bulk Si1−n/10 Gen/10 alloys with n=3, 5 and 7, and bulk Si. In particular we explore the possibility of constructing waveguides using the materials (Si)6/(Ge)4 SLS, coherently grown on a Si(001) surface, and bulk Si. We investigate the case of planar waveguide structure, giving results concerning the propagation and penetration of the transverse magnetic modes. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 5294-5299 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A systematic comparative study between the electronic and optical properties of the strain layer superlattices (Si)10−n/(Ge)n coherently grown on a Si1−n/10Gen/10(001) alloy surface and those of the corresponding bulk alloys Si1−n/10Gen/10 is presented. We find that the superlattices have a smaller fundamental gap than the corresponding alloys; also for energies smaller than 1.5 eV and polarization along the growth plane, the real part of the dielectric function, ε1, for the SLS is larger than that of the corresponding alloy, while for perpendicular polarization, the two dielectric functions practically coincide. The utilization of this property for the construction of planar waveguides is investigated. In particular, the transverse electric modes of a waveguide consisting of a finite thickness SLS (Si)6/(Ge)4, sandwiched between two layers of the alloy Si0.6Ge0.4, are studied. No transverse magnetic modes exist in this structure.
    Type of Medium: Electronic Resource
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  • 3
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    Unknown
    Pittsburgh, Pa., etc. : Periodicals Archive Online (PAO)
    Classical World. 34 (1940:Oct.-1941:June) 171-173 
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  • 4
    facet.materialart.
    Unknown
    Pittsburgh, Pa., etc. : Periodicals Archive Online (PAO)
    Classical World. 35 (1941:Oct.-1942:June) 209 
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  • 5
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Physics Letters B 197 (1987), S. 379-382 
    ISSN: 0370-2693
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Physics Letters B 115 (1982), S. 419-421 
    ISSN: 0370-2693
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    Experiments in fluids 28 (2000), S. 355-359 
    ISSN: 1432-1114
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract A photometric technique for film thickness measurements is described in this paper. It is based on the absorption of light passing through a layer of dyed liquid and takes advantage of small sized diode laser sources and sensitive light sensors. The method is non-intrusive, easy to use and to calibrate and can be implemented at relatively low cost. Laboratory tests of the technique have yielded satisfactory accuracy and repeatability. Moreover, the technique allows measurements with a good spatial resolution. Flowing film thickness measurements made photometrically are compared directly to measurements taken simultaneously with a “parallel wire conductance probe”. Time-averaged film heights, RMS values and other statistical information have been obtained by analyzing these instantaneous film thickness records. With regard to the time-averaged values of liquid film thickness, there is a satisfactory agreement between the two measuring techniques.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Springer
    Experiments in fluids 9 (1990), S. 205-212 
    ISSN: 1432-1114
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract This paper presents laser measurements of particle velocities in a horizontal turbulent two-phase pipe flow. A phase Doppler particle analyzer, (PDPA), was used to obtain particle size, velocity, and rms values of velocity fluctuations. The particulate phase consisted of glass spheres 50 μm in diameter with the volume fraction of the suspension in the range φ p=10-4 to φ p=10-3. The results show that the turbulence increases with particle loading.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Springer
    Experiments in fluids 2 (1984), S. 17-24 
    ISSN: 1432-1114
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Mean flow and turbulence measurements have been made in a boundary layer which grows first on a flat' wall and then on a convex wall of radius of curvature approximately 100 times the boundary layer thickness. The turbulence data include profiles of the four non-zero components of the Reynolds stress tensor and three triple velocity products obtained at five stream-wise positions. A number of measurements were also made for comparison in the boundary layer on a flat wall under the same conditions. The effects of convex curvature are to reduce turbulent intensities, shear stress and wall friction by approximately 10% of their plane flow values; the triple velocity products are halved in the curved layer. The measurements supplement the small quantity of previously published data available for testing mathematical models of turbulence. The results show the same general trends that have been observed in earlier investigations but there are significant differences in detail, notably in respect of levels of the normal stresses.
    Type of Medium: Electronic Resource
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