Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
69 (1998), S. 3614-3617
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A near field optical microscope with a scanning area up to 1 mm×1 mm was demonstrated. The scanning element is the tapered fiber probe and a cylindrical lens is used to focus the feedback laser. Instead of the vibrational amplitude, the vibrational angle signal is used to regulate the distance between the probe and sample. The microscope was employed to map out the evanescent wave on a channel waveguide. © 1998 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1149147
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