ISSN:
1432-0630
Keywords:
42.82
;
73
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract Measurements of the varying infrared absorption by free carriers in a silicon waveguide during intermittent electron bombardment are used to study the surface recombination velocitys. The same values for s are obtained for heat-treated and untreated samples, which supports the theory that electron beam irradiation in itself has a dehydrating effect. Other experiments show thats is not dependent on the energy of the impinging electrons in the range 16–23 keV. Finally, the temperature dependence ofs in gold-doped silicon is estimated. Ifs is written in the forms=s 0(293/T)x,x is found to be 2.1±0.2 in the temperature interval 261K≦T≦309K.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00617187
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