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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 62 (1993), S. 3019-3021 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Measurements of the microwave surface resistance of single crystals of YBa2(Cu1−xZnx)3O6.95 at 3.8 and 34.8 GHz have been performed with zinc contents of x=0, 0.0015, and 0.0031. The microwave loss in the superconducting state decreases when zinc impurities are added, demonstrating that some defects are required to achieve state-of-the-art surface resistance in this material.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 69 (1996), S. 2119-2121 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have applied ion-implantation inhibit patterning as a new method of fabricating low-loss microwave transmission lines in high-temperature superconductor thin films. To determine the effectiveness of this technique, we fabricated coplanar waveguide transmission lines in YBa2Cu3O7−δ thin films that had been deposited on LaAlO3 substrates using pulsed laser deposition. Microwave characterizations of these lines are compared to a reference line fabricated with conventional ion milling. At 76 K and 12 GHz, the attenuation constants of the ion-implanted transmission lines are approximated 0.02 dB/mm, and the overall loss response is indistinguishable from that of the ion-milled device. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1572-9605
    Keywords: Surface resistance ; high-temperature superconductors ; quasiparticle scattering
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract The surface resistance of YBa2(Cu1−x Zn x )3O7−δ has been measured in single crystals with oxygen vacancies ranging fromδ=0.03 to 0.15 and for Zn impurity concentrations ofx=0, 0.0015 and 0.0031. Oxygen vacancies in the CuO chains have little influence on the microwave loss untilT c is reduced substantially. However, Zn impurities in the CuO2 plane sites drasticallydecrease the surface resistance, showing that the CuO2 plane conductivity dominates any CuO chain contribution to the microwave properties of YBa2Cu3O7−δ. The reduced microwave loss in the Zn-doped samples mimics the loss observed in state-of-the-art films and indicates that defects must be present in order to achieve the low microwave loss observed in some films. This sensitivity to low levels of defects is a consequence of the rapid increase in the scattering time in YBa2Cu3O7−δ belowT c .
    Type of Medium: Electronic Resource
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