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  • 1985-1989  (3)
  • 1988  (3)
Material
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  • 1985-1989  (3)
Year
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 6000-6000 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The distribution of the critical field of nontextured polycrystalline ferrite is determined. Barium ferrite samples are saturated in one direction and measured with a field H applied at an angle θ to the saturation field. The measured quantities are the remanent magnetization and the microwave hysteresis including minor loops. Especially the microwave absorption curves allow direct analysis of the critical field as a function of the orientation angle cursive-theta0 between H and the easy axis. Starting with these data a fit of the calculated to the measured remanence curves yield the distribution. The figure shows the critical field distribution of a ferrite sample with large coercivity. Additionally the calculated and measured resonance fields ares are given. All field strengths are normalized to the anisotropy field, which can also be determined from the microwave measurement.1
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 5980-5982 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The magnetic stiffness is measured by the torsion pendulum method as a function of the applied field. Measurements are performed on random assemblies of chemically coprecipitated barium ferrite powders. The magnetic stiffness for both minor and major loops of the hysteresis cycle is measured and compared with calculated curves based on the model of coherent rotation. The discrepancies between theory and experiment are partly due to the effect of magnetic interaction.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 59 (1988), S. 1388-1393 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A very-high-sensitivity magnetometer is described in detail. The sensitivity of the apparatus is typically of the order of 10−9 A cm2/(Hz)1/2, so that changes in magnetic moment of 10−10 A cm2 can be detected. The magnetic moment can be calculated by simulation of the measurement system. An example of a hysteresis loop is shown. The size of the sample is determined by electron microscopy. The physical limits of the measurement system are worked out and discussed.
    Type of Medium: Electronic Resource
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