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  • 1
    Electronic Resource
    Electronic Resource
    Neutron-induced microwave loss in ceramic YBa2Cu3O7−δ (1990)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 56 (1990), S. 2462-2464 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: An increase by over three orders of magnitude from 0.58 mΩ to 1.17 Ω was observed at 4.0 K in the 3 GHz microwave surface resistance of ceramic YBa2Cu3O7−δ following exposure to neutrons. The transport resistivity of an unirradiated pellet was linear in temperature down to Tc with a room-temperature value of 2.13 mΩ cm and a resistivity extrapolated to 4.0 K of 0.53 mΩ cm. Following irradiation, the resistivity rose with decreasing temperature from a room-temperature value of 1.5 Ω cm to a maximum at around 45 K with little change evident at Tc . These results, in conjunction with eddy current, susceptibility, iodometric titration, and thermally stimulated luminescence measurements on irradiated and unirradiated samples, collectively suggest that the effect of neutron irradiation has been to decrease intergranular coupling without the development of an insulating phase.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.103256
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Microwave surface resistance and power dependence of thallium-based films deposited onto large-area silver substrates (1990)
    Springer
    Journal of superconductivity 3 (1990), S. 261-267 
    Details
    ISSN: 1572-9605
    Keywords: High-temperature superconductivity ; microwave surface impedance ; Tl-based superconducting films ; metallic substrates ; field dependence of surface resistance
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract Microwave surface resistance (R s ) measurements on large-area (11.4 cm2) Tl-based films deposited onto Ag (Consil 995) substrates have been made at a frequency of 18 GHz as a function of temperature. Deposition onto unoriented Ag substrates yields unoriented films characterized byR s values of 8.2 and 33.6 mΩ at 10.6 and 77 K, respectively. In contrast, similar deposition onto oriented Ag substrates yields oriented films with values of 12.6 and 14.6 mΩ at 11.2 and 77 K, respectively; corresponding Cu values are 9 and 21 mΩ. Additionally, it is found that the dependence ofR s on microwave surface magnetic fieldH s is weaker for the oriented films. These results suggest that the effect of orienting thec-axis in Tl films is twofold: (1) the high-frequency superconducting transition is made considerably sharper, resulting in a lowerR s value at 77 K, and (2) the rate of increase inR s with appliedH s is reduced. Both effects have significant ramifications for the potential application of these materials to high-frequency accelerating cavities.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00625266
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    RF properties of high-temperature superconductors: Cavity methods (1990)
    Springer
    Journal of superconductivity 3 (1990), S. 297-304 
    Details
    ISSN: 1572-9605
    Keywords: High-temperature superconductivity ; microwave cavities ; sample surface impedance
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract A description of cavities used in the study of the microwave properties of the high-temperature superconductors is followed by a lumped-circuit analysis of the coupling of transmission lines and resonators. The frequency dependence of the reflected and transmitted microwave power and the character of transient cavity response are analyzed. Techniques are discussed for the introduction of samples of the high-temperature superconductors into microwave cavities. Following a discussion of sample surface impedance and sample geometry factor, the connection between surface resistance and cavityQ is examined as well as the connection between cavity frequency shift and surface reactance. Measurement techniques that utilize reflected or transmitted power or transient response are described.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00625271
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    Paper (German National Licenses)
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