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  • 1995-1999  (3)
  • 1998  (3)
  • 1
    Electronic Resource
    Electronic Resource
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 5 (1998), S. 1058-1060 
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Photon–ion merged-beam apparatus using a compact ECR ion source and a high-brilliance light source has been designed for the study of photoabsorption processes of multiply charged ions. Photoion spectroscopy will be performed along isoelectronic, isonuclear and isoionic sequences. The main features of this apparatus are described.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 5 (1998), S. 673-675 
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The design and performance of a new water-cooled and doubly bent crystal monochromator for Compton scattering experiments are described. Its mechanical system is similar to that of a usual bent cylindrical X-ray mirror. A monolithic Si (111) crystal is mounted on a water-cooled and cylindrically polished copper crystal holder with liquid Ga–In alloy between them in order to obtain good thermal and mechanical contact. The sagittal bending radius of the holder, Rs, is 508 mm. The holder is mounted on a mechanical bender making a meridian radius, Rm, of 596 m. The performance of the monochromator, which has been installed at the Photon Factory Accumulator Ring beamline NE1, is as follows. The focused beam size, flux and energy resolution for 60 keV X-rays are 0.5 mm in height and 2.0 mm in width, 5 × 1012 photons s−1 and about 60 eV, respectively. The new monochromator gives one order higher brightness at the sample position and also better energy resolution than the previous monochromator. The overall momentum resolution for high-resolution Compton scattering experiments becomes 0.08 atomic units, and the background can be reduced by a third, because it is possible to insert a fine slit after the analyser crystal without losing any Compton scattering signal.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1435-1536
    Keywords: Key words Evanescent wave ; dynamic light scattering ; particle-wall interaction ; colloidal particle ; time-correlation function
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract  The diffusion behavior of polymer latex particles in dispersion near the quartz interface has been estimated by evanescent wave dynamic light scattering (EVDLS) technique. The diffusion coefficient of the particles was measured as a function of the distance between the particle and interface. The apparent diffusion coefficient estimated by EVDLS was small for particles near the interface and increased upon increasing the distance from the interface, and then saturated at a certain value which is close to the value expected for free-motion. The range of the distance over which diffusion was affected by interaction with the interface depended on the added salt concentration. This means that the diffusion of the particle is influenced by an electrostatic interaction between the particle and quartz interface in addition to the hydrodynamic effect near the wall. This range was found to be more than 800 nm at 0 M salt condition but about 400 nm at 10-4 and 10-3 M salt conditions. Hence it is appropriate to say that the hydrodynamic effect reaches up to 400 nm and the electrostatic effect is longer ranged, more than 800 nm, for the system studied here. The EVDLS technique is a very powerful tool for quantitative estimations of the dynamic behavior of the particle near the interface and for estimation of the range where the wall effect is dominant. EVDLS will give us an answer to the question of “where is the ‘interface’ and where is the ‘bulk’?”.
    Type of Medium: Electronic Resource
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