ISSN:
1662-9752
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
When the Al/Ge/SiO2 bilayer films are annealed in-situ in a scanning electron microscope(SEM) at the temperatures lower than the crystallization temperature of amorphous Ge itself, theso-called metal-mediated-crystallization (MMC) takes place. In the course of MMC, crystalline Geaggregates (Ge clusters) form in the bilayer films, which results in the formation and the evolution ofimpressive fractal patterns with branching on the free surface. In-situ SEM observations of annealedAl/Ge/SiO2 bilayer films indicate that the grain size of polycrystalline Al-layer influences thenucleation of Ge clusters and hence of fractal patterns. For the bilayer films containing larger Algrains, the nucleation rate of fractal patterns (Ge clusters) is faster and the number of patterns is larger
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/02/15/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.539-543.3568.pdf
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