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  • 2000-2004  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 7171-7173 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ultrafast magnetization reversal dynamics in a 15-nm-thick Ni80Fe20 microstructure (10 μm×2 μm) is studied using both time-resolved scanning Kerr microscopy and numerical simulation. The time dependence of the magnetization component along the magnetic easy axis reveals a dramatic reduction in switching time, when the magnetization vector is pulsed by a longitudinal switching field while a steady transverse biasing field is applied. According to the time domain images, the abrupt change of the switching time is due to the change in the magnetization reversal mode; i.e., the nucleation dominant reversal process is replaced by domain wall motion if a transverse biasing field is applied. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 6830-6832 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have measured and simulated dynamics of magnetization reversal in a micrometer scale Ni80Fe20 polycrystalline thin film element in the time domain. The sample is probed experimentally using time-resolved scanning Kerr microscopy. This allows for spatially resolved images of the dynamical magnetization states. We have simulated these magnetic reversals micromagnetically for the case of an ideal rectangular element. The reversal rates agree semiqualitatively, and gross spatial features such as a stripe instability in the directions perpendicular to the applied field are reproduced. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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