Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
89 (2001), S. 7171-7173
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Ultrafast magnetization reversal dynamics in a 15-nm-thick Ni80Fe20 microstructure (10 μm×2 μm) is studied using both time-resolved scanning Kerr microscopy and numerical simulation. The time dependence of the magnetization component along the magnetic easy axis reveals a dramatic reduction in switching time, when the magnetization vector is pulsed by a longitudinal switching field while a steady transverse biasing field is applied. According to the time domain images, the abrupt change of the switching time is due to the change in the magnetization reversal mode; i.e., the nucleation dominant reversal process is replaced by domain wall motion if a transverse biasing field is applied. © 2001 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1358819
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