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  • 2000-2004  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    Waveguide ultrasonic force microscopy at 60 MHz (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 1836-1838 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present measurements using ultrasonic force microscopy at ∼60 MHz, operating in a "waveguide" mode in which the cantilever base is vibrated and flexural ultrasonic vibrations are launched down the cantilever without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected in a conventional atomic force microscope. Images of Ge quantum dots on a Si substrate show contrast related to elasticity and adhesion differences, and this is interpreted with the Johnson–Kendall–Roberts model of the force-distance curve. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.126184
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Measurement of debonding in cracked nanocomposite films by ultrasonic force microscopy (2002)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 80 (2002), S. 1180-1182 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This letter reports the application of ultrasonic force microscopy (UFM) to investigate subsurface fracture mechanisms during tensile loading of nanocomposite films consisting of a brittle glass on a ductile polyethylene terephthalate (PET) substrate. Such materials are used in packaging applications where a gas barrier is required to maintain the product quality. Cracking or debonding of the surface glass layer results in destruction of the gas barrier properties of the film. Accurate evaluation of the continuity or discontinuity at the crack edge within the layered material is crucial for the correct characterization of both adhesive failure and crack propagation. Here simultaneous atomic force microscopy and UFM images are compared for a range of tensile strains to identify debonded regions of the glass film from the PET. Debonding occurred for strains greater than 6%. In some films, this debonding increased with applied strain. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1450058
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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