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  • 1995-1999  (8)
Source
Material
Years
Year
  • 1
    Electronic Resource
    Electronic Resource
    Microstructural and micromagnetic characterization of thin film magnetic tunnel junctions (1999)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 85 (1999), S. 4815-4817 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: High-resolution electron microscopy, Lorentz microscopy, and off-axis electron holography have been used to characterize magnetic tunnel junctions. Observations in cross section show that the tunnel barriers are slightly narrower and smoother after annealing at temperatures up to 350 °C. The demagnetization of a magnetically hard CoPtCr reference layer through repeated magnetization reversal of a soft layer of either Co or Ni40Fe60 is likely to originate from magnetic fringing fields at Néel walls, which form in the soft layers close to the coercive field. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.370491
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Magnetic interactions within patterned cobalt nanostructures using off-axis electron holography (1998)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 84 (1998), S. 374-378 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The magnetization reversal behavior of submicron-sized patterned Co elements has been studied using off-axis electron holography. Magnetic fields were applied to the samples in situ to determine both the hysteresis loops of individual elements and the interactions between closely spaced elements. The observations show that an understanding of the formation of remanent states is likely to be of particular importance for the design of magnetic elements for device applications. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.368038
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Switching asymmetries in closely coupled magnetic nanostructure arrays (1999)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 75 (1999), S. 2641-2643 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Cobalt nanostructures (220 and 300 nm×275 nm×30 nm) were fabricated using electron beam lithography into ordered, close proximity (170 nm) arrays. Domain configurations with accompanying hysteresis loops were measured using off-axis electron holography. Measurements were compared to solutions of the Landau–Lifshitz–Gilbert equations. Both exhibit switching asymmetries due to strong intercell coupling and the presence of a field normal to the cell surface. Magnetic domain configurations during switching depended strongly on the initial conditions, as well as the direction of the perpendicular field relative to the in-plane hysteresis-field direction. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.125104
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Simulations for imaging with atomic focusers (1999)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 55 (1999), S. 119-126 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The basis has been explored for the possible application of the various schemes that have been proposed for making use of the focusing properties of single heavy atoms, or rows of atoms extending through thin crystals in axial directions, for the attainment of ultra-high resolution in electron microscopy. Calculations are reported for the form of 200 keV electron beams channeled along rows of atoms through crystals and propagated in the vacuum beyond the crystals. The conditions for forming beams less than 0.05 nm in diameter have been established. Simulations of images having resolutions of this order are reported for the case that the specimen is placed at the Fourier image position beyond the exit face of a thin crystal and the transmission of the periodic array of ultra-fine beams, translated laterally by tilting the incident beam, may be observable using a conventional transmission-electron-microscopy (TEM) instrument.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767398006989
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    Paper (German National Licenses)
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  • 5
    Electronic Resource
    Electronic Resource
    The Electrostatic Contribution to the Forward-Scattering Potential at a Space Charge Layer in High-Energy Electron Diffraction. II. Fringing Fields (1997)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 53 (1997), S. 242-250 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The electrostatic potential is determined both inside and outside a parallel-sided dielectric slab that contains a space charge layer whose plane is perpendicular to the surfaces of the slab, with particular reference to the use of phase-contrast techniques in transmission electron microscopy to characterize such layers.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767396015243
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    Paper (German National Licenses)
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  • 6
    Electronic Resource
    Electronic Resource
    Determination of mean inner potential of germanium using off-axis electron holography (1999)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 55 (1999), S. 652-658 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Off-axis electron holography has been used to determine the mean inner potential of germanium using cleaved 90° wedge samples, where the wedge thickness profiles were checked by weak-beam dark-field extinction fringes. Dynamical contributions to the phase of the image were minimized by tilting to weakly diffracting conditions, as confirmed by reference to convergent-beam electron diffraction patterns. Small residual corrections were determined using multislice calculations. From a total of 18 separate measurements, it is concluded that the value of the mean inner potential is 14.3 (2) V, which agrees with recent theoretical calculations to within experimental error.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S010876739801719X
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    Paper (German National Licenses)
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  • 7
    Electronic Resource
    Electronic Resource
    The Electrostatic Contribution to the Forward-Scattering Potential at aSpace Charge Layer in High-Energy Electron Diffraction. I. Theory Neglecting the Effects of Fringing Fields (1996)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 52 (1996), S. 705-711 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Expressions for the electrostatic potential at an interfacial space charge layer are determined using classical electrostatics, with particular reference to the use of phase-contrast techniques in transmission electron microscopy for characterizing such layers. Both the sensitivity of the potential to the detailed form of the charge distribution and the effect of the internal electric field on the strain within the material are discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767396004643
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    Paper (German National Licenses)
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  • 8
    Electronic Resource
    Electronic Resource
    Moiré patterns in electron microscopy with atomic focuser crystals (1999)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 55 (1999), S. 533-542 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The periodic array of very fine cross-overs formed at the exit face of a thin `atomic focuser' crystal, illuminated by a parallel electron beam, may be used to form moiré patterns with a specimen crystal such that the structure of the specimen crystal may be derived with a resolution of better than 0.5 Å. Computer simulations of the moiré pattern formation have been made for the simple idealized case of two parallel gold-like lattices having a 10% difference in lattice constant. Moiré images are shown for the case of a small objective aperture in the viewing electron microscope such that the individual crystal lattices are not resolved and for a larger objective aperture for which the individual crystal lattices are resolved and the intensity is measured at the positions of the atoms of the atomic focuser crystal. The latter case confirms the viability of the scheme for ultra-high-resolution imaging of general specimens by use of a thin-crystal periodic atomic focuser, as previously proposed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767398014950
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    Paper (German National Licenses)
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