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  • 1990-1994  (10)
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Year
  • 1
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Annals of the New York Academy of Sciences 589 (1990), S. 0 
    ISSN: 1749-6632
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Natural Sciences in General
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: An analytical method based on a new theoretical model for the x-ray energy responses of silicon surface-barrier (SSB) detectors has been proposed. This method may address a recent confusing issue in the x-ray detection characteristics of SSB semiconductor detectors; that is, the x-ray responses of SSB detectors as well as p-i-n diodes used in underbiased operations were recently found to be contrary to the commonly held belief that the x-ray sensitivity of an SSB detector is determined by the thickness of the depletion layer. The model presented includes a signal contribution from thermally diffusing charge that is created in the field-free substrate region within a diffusion length from the depletion layer along with a signal contribution from charge created in the depletion layer. This model predicts a large signal contribution from the charge-diffusion effect on the SSB responses to high-energy x rays. Formulas and calculated results supporting SSB calibration data have been represented. These analytical methods might be developed to apply the analyses and predictions of energy responses of various types of silicon detectors including p-i-n diodes as well as charge-coupled devices.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The effect of thermal-diffusion charge on the x-ray energy response of silicon surface-barrier (SSB) detectors have generally been ignored; consequently, the SSB response has been believed to be analyzed using the thickness of the depletion layer alone. Our new theory on the SSB x-ray response [J. Appl. Phys. 72, 3363 (1992)] was prepared for addressing recent confusion on plasma x-ray analyses using SSB detectors [Rev. Sci. Instrum. 59, 1380 (1988); 61, 693 (1990); 63, 4850 (1992)]. This approach was made under the assumption of a dominant contribution of the diffusion-charge signal in the vicinity of the x-ray incident location because of the strong reduction of the x-ray produced charge within the thermal-diffusion length. In this report, the comparison between this approximation (having an approximated solution) and the exact numerical calculation (using an integral form) is carried out. Necessity and importance of such three-dimensional treatments for the data analyses as well as the design of multichannel semiconductor-array detectors developed for plasma x-ray tomography diagnostics are highlighted. Furthermore, for the total diffusing-charge amount, the calculated results from our theory and the values using the comment from Donolato agree well within the accuracy of 1%.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 1694-1699 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Tomographic reconstructions of x-ray emission from hot electrons have been carried out in the thermal barrier region of the GAMMA 10 plasmas. Here, the first application of two sets of the 50-channel microchannel plates have been performed using their detailed calibration data as a function of x-ray energy and incident angle [Rev. Sci. Instrum. 59, 256 (1988); 59, 2453 (1988); 60, 368 (1989)]. The x-ray reconstructed signals under standard thermal barrier operating conditions indicate a good axisymmetric radial profile peaked on the magnetic axis. This symmetric profile is important for preventing the formation of a local anisotropic electric field, which may cause particle confinement degradation, and its peaking profile is desirable for thermal barrier potential formation in the core plasma region. When we have relocated the second-harmonic electron cyclotron layers (ω=2Ωe) in two different ways (moving them out radially, or axially away from the midplane), tomographic reconstructions show hollow x-ray profiles in both cases. These may be formed due to the E×B rotations of the hot electrons produced near ω=2Ωe . These applications of x-ray tomography to two-dimensional radial profile observations along with the axial x-ray profile measurement give information that the production mechanism of these hot electrons is ascribed to second-harmonic electron cyclotron heating.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    New York, NY : American Institute of Physics (AIP)
    Physics of Fluids 5 (1993), S. 866-871 
    ISSN: 1089-7666
    Source: AIP Digital Archive
    Topics: Physics
    Notes: An empirical scaling for the potential difference between the plug potential ΦP and the floating potential ΦEP of an endplate is obtained in terms of end-loss electron temperatures. Results from the GAMMA 10 tandem mirror [Phys. Rev. Lett. 55, 939 (1985)] indicate that ΔΦ=ΦP−ΦEP scales much better with an effective temperature Teff≡(1−β)TeL+βTeH than with a single temperature TeL or TeH, where TeL and TeH are temperatures of the bulk and the high-energy tail components of the end-loss electrons and β denotes the flux fraction of the TeH component. Moreover, the observed scaling is consistent with a recently developed theoretical model [K. Kurihara et al., J. Phys. Soc. Jpn. 61, 3153 (1992)].
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 936-942 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new type of end-loss-ion energy analyzer (ELA; a multigridded Faraday cup) is applied to measure plasma ion temperatures Tip and plasma potentials ΦP in the GAMMA 10 tandem-mirror device. As compared with conventional-type ELA, this new ELA has obliquely placed ion- and secondary-electron-repeller grids and a collector plate with respect to external tandem-mirror magnetic fields. One of the most useful capabilities of this new ELA for precise ion measurements is to greatly reduce the current of high-energy electrons onto the collector plate. Also, this compact-sized ELA is scannable in the plasma to obtain radial profiles of Tip and ΦP without providing any perturbations of the tandem-mirror magnetic fields because it neither adds its own magnetic field nor needs to shield against the ambient magnetic field. Ion trajectories in the new ELA are numerically calculated so as to make a further understanding of its physics principles and to optimize its design. The energy-calibration experiments for the new ELA are carried out using ion beams; a fairly good agreement in the analyzed beam energies from the new ELA data and from conventional-type ELA data is attained. Furthermore, the first application of the new ELA to plasma diagnostics is made; a substantial reduction in energetic-electron influxes onto real ion signals makes a significant improvement in the analyses of Tip and ΦP.
    Type of Medium: Electronic Resource
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  • 7
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The characteristics of microchannel plates (MCPs) for x-ray detection have been investigated with continuous x-ray energy variation using synchrotron radiation in the XUV and soft x-ray region (from 60 to 600 eV). The current response data have shown x-ray absorption fine structure (EXAFS or XANES) near the oxygen K absorption edge as well as a jump structure near the silicon L edge; these structures are explained by the surface composition of channel walls (SiO2). The data show that the surface layer of a microchannel is essential for x-ray detection by MCPs in this energy range. The precise current response curve has been completed for the wide x-ray energy range from 0.06 to 82 keV combined with the previously reported data [Kondoh et al., Rev. Sci. Instrum. 59, 252 (1988); Cho et al., ibid. 59, 2453 (1988); Yamaguchi et al., ibid. 60, 368, 2307 (1989)].
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 9 (1990), S. 463-465 
    ISSN: 1573-4811
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Springer
    International orthopaedics 16 (1992), S. 277-281 
    ISSN: 1432-5195
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Description / Table of Contents: Résumé Description d'une nouvelle méthode de mesure de l'antéversion fémorale que l'on peut considérer comme une modification de celle de Magilligan. On pratique deux clichés radiographiques: une vraie hanche de face et un profil de hanche, au lieu du profil du col de la méthode de Magilligan. On mesure les angles aigus α et γ formés par les axes de la diaphyse et du col sur les deux clichés. L'angle γ' d'antéversion est obtenu par la formule trigonométrique: $$tan \gamma = tan \gamma /tan \alpha .$$ L'antéversion fémorale été mesurée sur 20 fémurs secs d'adultes et sur les 40 fémurs de 20 enfants par la méthode de Magilligan, par celle des auteurs et par tomodensitométrie. Par comparaison avec la mesure directe faite sur les fémurs secs on a trouvé que la méthode de Magilligan et celle des auteurs ont tendance à sur-estimer et la tomodensitométrie à sous-estimer (p〈0.05) l'antéversion. Sur les fémurs d'enfants une tendance similaire a été notée avec les trois méthodes et les mesures obtenues par chacune d'entre elles étaient significativement différentes (p〈0.05). Nous pensons que notre méthode de mesure de l'antéversion fémorale est plus précise, bien que sans doute relativement, que celle de Magilligan. Elle présente par ailleurs certains avantages pratiques, l'installation du malade est plus facile, la rotation mieux contrôlée et la réalisation des radiographies est plus rapide.
    Notes: Summary A new biplanar method of measuring femoral anteversion, which may be considered a modified Magilligan's method, is described. In addition to the true antero-posterior radiograph, a true translateral radiograph is taken, instead of a transcervical lateral radiograph as in the Magilligan method. The acute angles (α and γ) between the long axes of the shaft and neck of the femur on both the antero-lateral and lateral radiographs are measured. The angle (γ′) of anteversion is obtained by the trigonometric formula; $$tan \gamma = tan \gamma /tan \alpha .$$ The femoral anteversion in 20 adult dried femora and 40 femora in 20 children was measured by the Magilligan method, the authors' method and the conventional CT method. Compared with direct measurement in the dried femora, it was found that both the Magilligan and the authors' methods tended to overestimate and the CT method tended to underestimate (p〈0.05) the anteversion. In children's femora, a similar trend was observed among the three methods and the measurements by each method differed significantly from the other (p〈0.05). We feed that our method of biplanar measurement of femoral anteversion is more accurate, although probably marginally, than the conventional Magilligan method. It also has some relative advantages in clinical application in that positioning is easier, rotation is better controlled, and less time is consumed.
    Type of Medium: Electronic Resource
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  • 10
    ISSN: 1573-4811
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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