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  • 1990-1994  (2)
  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 63 (1993), S. 2771-2773 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Photoluminescence measurements and high-resolution transmission electron microscopy studies on spark-treated (porous) silicon have been performed. Contrary to suggestions put forward by others, it has been found that spark erosion does not yield structures comparable to those obtained for irradiated, that is, damaged silica. Instead, evidence is given that spark treatment of single crystalline silicon wafers produces randomly oriented nanometer-sized silicon crystallites surrounded by a SiO2 matrix. This configuration is believed to be responsible for the observed room temperature visible photoluminescence.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 61 (1992), S. 1965-1967 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have performed photoluminescence studies on porous, p-type as well as n-type silicon wafers which have been prepared in air or in a dry nitrogen atmosphere, utilizing a spark-erosion technique. This sample preparation, which does not involve aqueous solutions or fluorine contaminants, yields similar photoluminescence spectra as those obtained by anodic etching in HF or unbiased etching in various HF-containing reagents. The wavelength of the photoluminescence peaks are somewhat shifted into the blue region compared to porous silicon obtained by anodic etching. We have also taken photoluminescence spectra on amorphous silicon, SiO2, and oxidized, annealed porous silicon. Our results are interpreted in the light of the presently suggested theories.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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