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  • 1
    Electronic Resource
    Electronic Resource
    Prokinetic effect of AS-4370 on gastric emptying in healthy adults (1991)
    Springer
    European journal of clinical pharmacology 41 (1991), S. 335-337 
    Details
    ISSN: 1432-1041
    Keywords: Gastric emptying ; AS-4370 ; healthy adults ; benzamide analogue ; acetylcholine release
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Medicine
    Notes: Summary The effect of AS-4370 on gastric emptying was investigated in healthy adults using 99mTc-DTPA. Single doses of AS-4370 2.5, 5 or 10 mg or placebo were administered to 12 subjects in a controlled, double-blind, cross-over study. Tests were performed twice weekly in each subject. Thirty min after administration of test drug or placebo, each subject swallowed a bun and orange juice containing 200 μCi nuclide. The radioactivity of the gastric content was measured for 40 min and the activity of the residue was expressed as a percentage of count at the initiation of measurements. The percentage radioactivity, AUC and gastric emptying time fitted by a power exponential curve, were analyzed. No significant difference was observed between the three dose levels of AS-4370 and placebo in half emptying time. However, decreases in the percentage of radioactivity with time were noted: 5 mg at 10 to 16 min and 10 mg at 8 to 24 min after the start of recording. Lower AUCs after 5 mg and 10 mg compared to placebo were also found. The half emptying time was also shorter after 5 mg and 10 mg than placebo. There was no difference in these parameters between 2.5 mg and placebo. The results indicate that AS-4370 5 and 10 mg but not 2.5 mg accelerates gastric emptying in healthy adults.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00314963
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  • 2
    Electronic Resource
    Electronic Resource
    Monte Carlo simulation of x-ray spectra in electron probe microanalysis: Comparison of continuum with experiment (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 7180-7187 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A Monte Carlo simulation code has been developed to describe the x-ray generation in a specimen for electron probe microanalysis (EPMA), enabling x-ray spectra observed by EPMA to be reproduced theoretically. The Monte Carlo simulation is based on the use of the Mott cross section and Bethe stopping power equation in describing elastic and inelastic scattering processes, respectively. With respect to x-ray generation the Sommerfeld theory for bremsstrahlung radiation was described by equations of Kirkpatrick–Wiedmann and of Statham for bremsstrahlung cross section. The up-to-date compilation of mass absorption coefficient by Henke, Gullikson, and Davis [At. Data Nucl. Data Tables 54, 181 (1993)] is used to evaluate attenuation of x-ray intensity. To verify the present Monte Carlo simulation measurements of x-ray spectra for Cu and Rh targets have been performed for primary electron energies of 10–30 keV by energy-dispersive x-ray spectrometry of an electron probe microanalyzer. Excellent agreement between experimental spectra and calculated results has been confirmed in the cases investigated, leading to the conclusion that the Monte Carlo simulation technique will be a powerful tool for more comprehensive understanding of x-ray generation in EPMA specimens. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.357998
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  • 3
    Electronic Resource
    Electronic Resource
    Background formation in the low-energy region in Auger electron spectroscopy (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 1187-1195 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Monte Carlo simulations of cascade processes of secondary electron generation in Si, Cu, and Au have been performed to study the energy distribution of backscattered electrons in the low-energy region. Calculation results show that the characteristic hump appearing in the energy distribution above Si-LVV Auger peak in the EN(E) spectrum can be well described by those electrons ejected from the L shell followed by the cascade process. The shape of EN(E) spectra in the low-energy region is dominated by the directly produced secondary electrons and, hence, strongly correlated with the excitation spectrum Im[−1/ε(ω)] for electron generation.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.357844
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  • 4
    Electronic Resource
    Electronic Resource
    A compact electron-gun evaporation source for highly stable evaporation of refractory metals (1993)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 3647-3648 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An evaporation source of simple and compact construction was devised. This source is 20 mm in diameter and 30 mm long; is composed of a ring filament, control aperture, and disk-shaped sample (source) and shield cover; and enables the evaporation of source material to be easily controlled at a constant rate without the use of a feedback system. This evaporation source ensures depositions at constant rates for several hours. Refractory metal films of several thousand angstroms thickness can be deposited onto substrates held 10 cm from the source. Typical performance characteristics in the application to Ti films are presented.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144245
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  • 5
    Electronic Resource
    Electronic Resource
    Activities of ISO technical committee 201 on surface chemical analysis (1994)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 21 (1994), S. 615-620 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A status report is given on activities of ISO Technical Committee 201 (ISO/TC 201) on Surface Chemical Analysis. The committee has seven subcommittees which met for the first time in 1993. Information is given on the working groups that have been established for specific purposes. We show national participation in ISO/TC 201 and its subcommittees, and we identify the chairmen and secretariats of the subcommittees and the conveners of the working groups.
    Additional Material: 10 Tab.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740210904
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  • 6
    Electronic Resource
    Electronic Resource
    Formation of Technical Committee 201 on Surface Chemical Analysis by the International Organization for Standardization (1993)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 20 (1993), S. 322-325 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The International Organization of Standardization (ISO) recently created a new Technical Comittee (ISO/TC 201) on Surface Chemical Analysis in response to a proposal from Japan. As of February 1993, ten national standards bodies had indicated willingness to become participating members of ISO/TC 201 (Austria, China, Germany, Italy, Japan, Russia, Sweden, Turkey, the United Kingdom and the United States of America) and fifteen national standards bodies had indicated willingness to become observer members (Australia, Belgium, Egypt, Finland, France, India, Ireland, Korea, Norway, Philippines, Poland, Romania, Singapore, South Africa and Switzerland). The following subcommittees are planned: Terminology; General Procedures; Data Management and Treatment; Depth Profiling; Auger Electron Spectroscopy; Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy. It is expected that working groups will be established for Glow Discharge Optical Spectroscopy and Total Reflection X-ray Fluorescence Spectroscopy. ISO/TC 201 will develop international standards and will consider standards and documents prepared by other groups as potential international standards. Information is given in this article on the purpose, structure and planned work of ISO/TC 201.
    Additional Material: 3 Tab.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740200410
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  • 7
    Electronic Resource
    Electronic Resource
    The reliability of quantitative analysis with AES (1990)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 16 (1990), S. 140-143 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The Japanese VAMAS-SCA working group is composed of 19 institutes. Three kind of Au—Cu alloys (Au 75 at.-%-Cu 25 at.-%, Au 50 at.-%-Cu 50 at.-%, Au 25 at.-%-Cu 75 at.-%) were prepared, and these specimens, pure Au and pure Cu were distributed to the members of the VAMAS-SCA working group. The surface concentrations of these alloys were calculated from the Auger peak amplitudes in two ways. One method used the published relative sensitivity factors, and the other used pure Au and Pure Cu as the standard materials. The mean values of the surface concentrations calculated with the published relative sensitivity factors were almost the same as those calculated with the standard materials. This means that the published relative sensitivity factors are reliable to some extent. The error of the surface concentration calculated with pure Au and pure Cu as the standard materials lay between about 3% and 10%, and that with the relative sensitivity factors lay between about 7% and 20%. The calculated surface concentrations of Au were larger than the bulk concentrations of Au when the matrix effect was neglected.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740160127
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  • 8
    Electronic Resource
    Electronic Resource
    Evaluation of correction accuracy of several schemes for AES matrix effect correctionsPaper presented at ECASIA 89, Antibes, France, 23-27 October 1989. (1990)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 15 (1990), S. 466-472 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A matrix effect correction is required to improve the accuracy of quantitative AES analysis. The correction includes terms involving the atomic density (n), electron back-scattering factor (R) and electron escape depth (L). Many schemes have been proposed by various people for corrections of the R and L terms. However, up to now, there have been no systematic investigations of the correction accuracy of the proposed schemes. We have evaluated the correction accuracy, based on measured intensity data for Au—Cu alloys of different compositions. Comparison was made between the observed intensity ratio K (=Iunk/Istd) and the calculated intensity, ratio K′ (= C(nunk/nstd)(Runk/Rstd)(Lunk/Lstd)), where C and I represent the concentration and intensity, respectively. The superscripts ‘unk’ and ‘std’ denote that the parameters are for unknown and standard specimens, here the pure elements. If the correction works well, the error Er (= K′ — K)/(K) will become smaller. Evaluations were carried out on three schemes for the R correction and on seven schemes for the L correction using the Au 239 eV, Au 2024 eV and Cu 920 eV transitions. The root mean square (RMS) of the calculated errors showed several per cent for the best case and 20-30% for the worst case. The RMS error varied a few per cent between schemes for the R correction but it varied ∼30% for the L correction.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740150805
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