Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
64 (1994), S. 3464-3466
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Capacitance-applied voltage and internal charge-phosphor field characteristics of SrS:Ce thin film electroluminescent devices have been studied. The average phosphor field of the SrS:Ce films reaches the maximum of 1.3 MV/cm and relaxes to 0.7 MV/cm, although the applied voltage increases. The turn-on voltage of the SrS:Ce thin film electroluminescent device decreases nonlinearly with increase of conduction charge and depends on the slew rate dV/dt. A large spike current is observed and is thought to correspond to the charge generation in the SrS:Ce layer, which results in the space charge, and causes a relaxation of phosphor field in the SrS:Ce films.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.111242
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