Library

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • 1990-1994  (3)
Source
Material
Years
Year
  • 1
    Electronic Resource
    Electronic Resource
    Investigation of the micromagnetic structure of cross-tie walls in permalloy (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 2447-2452 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The modified differential phase contrast (MDPC) mode of Lorentz electron microscopy was used to study the micromagnetic structure of cross-tie walls in permalloy. The distribution of magnetic induction along these walls is characterized and studied in detail by vector mappings calculated from MDPC image pairs. The wall thickness of the cross-tie wall is determined by fitting the calculated image signal of an analytical function to the MDPC wall profiles. A pronounced dip in the wall width is found at the center of the vortex structure of the cross-tie wall. The results are compared to theoretical calculations by Nakatani, Uesaka, and Hayashi, Jpn. J. Appl. Phys. 28, 2485 (1989).
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.353102
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Scanning tunneling microscopy on rough surfaces: Tip-shape-limited resolution (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 1156-1159 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This paper discusses the reliability of scanning tunneling microscopy (STM) images of mesoscopically rough surfaces. The specific structure of these images represents a convolution between the real surface topography and the shape of the tip. In order to interpret these images quantitatively, the line scans of steep and high steps can be used to obtain an image of the tip itself. This image shows tip radii ranging typically from 5 to 15 nm and cone angles of about 30° over a length of 80 nm, and can in turn be used to recognize the limits of STM resolution on a rough surface: High-resolution transmission electron microscopy cross-section images of Au island films on a Au-Nb double layer are convoluted with the experimentally observed tip shape; the resulting line scans correspond very well with STM graphs of the same samples. Finally an overall criterion for the resolution of the STM on such surfaces is proposed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.345712
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Spatial confinement of misfit dislocations at the interface of CdSe/GaAs(111) (1993)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 63 (1993), S. 2947-2948 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: High-resolution electron microscopy of wurtzite type CdSe epilayers grown on (111) GaAs revealed that interfacial misfit dislocations are perfect 60° dislocations with Burgers vectors parallel to the interface. Glide is therefore limited to the (0001) interface plane and the extension of dislocations into the epilayer is suppressed. Single-beam bright field imaging shows that the 7% mismatched epilayer is free of a dislocation network in its volume.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.110281
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...