ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
Fluorescence detection is often used to obtain the extended x-ray absorption fine structure (EXAFS) of dilute samples and thin films. As the samples become concentrated and the films become thick, significant errors can be introduced in the EXAFS amplitudes. With detailed calculations we determine the reduction in the coordination numbers (N) and the deviation in the mean-squared relative displacements (σ2) as determined by fluorescence detection. Experimental results on Cu, Ni, Fe, and Nb samples support the predictions of the calculation. We suggest corrections to obtain the correct coordination numbers and σ2 values for studies of concentrated samples by fluorescence EXAFS detection when other methods are not feasible.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1140311
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