ISSN:
1573-4803
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract A lamellar NiO-ZrO2(CaO) eutectic has been studied by X-ray diffraction techniques and transmission electron microscopy in order to characterize its crystallography (orientation relation between phases and indexations of interlamellar plane and growth direction) and to compare the information which results from both methods. X-ray techniques have indicated an orientation relation (100) [001] ZrO2 (111) [1¯10] NiO associated with a lamellar interface (100) ZrO2 ∥ (111) NiO and with a growth direction [001] ZrO2 ∥ [1¯10] NiO. Transmission electron microscopy has confirmed this orientation relation (adopted by about 80% of the lamellae) as well as the orientation of the lamellar plane. Growth directions, however, were not as systematically well-defined as expected from the X-ray study. In addition, a minor homogeneous population (10% of the lamellae) corresponding to (hkl) [uvw] ZrO2 ∥ (hkl) [uvw] NiO was also observed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF01107442
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