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  • 1985-1989  (8)
  • 1
    Electronic Resource
    Electronic Resource
    Quantitative surface analysis by XPS and XAS (1988)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 12 (1988), S. 137-143 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: As X-ray excited Auger spectra are included in quantitative surface analysis a careful investigation of all possible excitation mechanisms must be made. For instruments with a monochromator there is only the specific characteristic radiation but instruments without a monochromator offer a wide variety of Auger excitations: white x-radiation (target); satellites (target); O Kα (oxidized target); Cu Lα (target substrate); and Al Kα (tube window).The present paper deals with the quantification of additional X-ray excitations of KLL-Auger spectra from these sources. The numerical results illustrate our experimental situation. With these data it becomes possible to use X-ray excited KLL-Auger lines in a fundamental parameter approach for quantitative analysis.
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740120214
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Excitation of KLL-auger spectra by white X-radiation (1988)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 12 (1988), S. 175-176 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Additional Material: 2 Tab.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740120228
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    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Thin Si3N4 films on Si wafers (1988)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 12 (1988), S. 322-323 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Additional Material: 1 Tab.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740120510
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Experiments on imaging X-ray analytical methodsPaper presented at ECASIA 87, Stuttgart, FRG, 19-23 october 1987. (1989)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 14 (1989), S. 163-169 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: X-ray induced analysis of matter offers solutions to a great variety of analyst's questions in various disciplines. Based on the physical nature of primary interaction (photoelectric absorption, elastic/inelastic scattering) and on the secondary specimen response (modulated primary radiation, fluorescent radiation, photoelectrons, Auger electrons), a powerful family of different analytical techniques has evolved. This paper emphasizes the methods of x-ray photoeletron spectrometry (XPS) and x-ray fluorescence analysis (XRF), covering depth information ranging from ca. 1 nm (XPS) to 〉 10 μm (XRF). Scanning schemes to extract spatial resolution of the specific analytical signal are presented. These methods operate in (hardware-based) line-selection modes during data acquisition and are essentially based on computer-(software-)aided data decoding to achieve point information (element map). Operating principles, alternative concepts, experimental set ups, results and some future trends are summarized.
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740140402
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    Paper (German National Licenses)
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  • 5
    Electronic Resource
    Electronic Resource
    The energy dependence of attenuation lengths in elements (1988)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 12 (1988), S. 172-173 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Additional Material: 2 Tab.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740120226
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    Paper (German National Licenses)
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  • 6
    Electronic Resource
    Electronic Resource
    Magnesium enrichment on the surface of aluminium foils (1988)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 12 (1988), S. 228-229 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Additional Material: 2 Tab.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740120314
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    Paper (German National Licenses)
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  • 7
    Electronic Resource
    Electronic Resource
    Quantification of continuous and characteristic tube spectra for fundamental parameter analysis (1989)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 18 (1989), S. 89-100 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The response of white radiation, expressed as the number of photons per second and energy interval versus energy, is an essential quantity in quantitative x-ray fluorescence analysis using fundamental parameters. Our investigations gave the best fit of experimental results obtained from ten elements (6 ≤ Z ≤ 82) in the energy range of photons from 3 to 30 keV by the equation
    Additional Material: 13 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300180304
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    Paper (German National Licenses)
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  • 8
    Electronic Resource
    Electronic Resource
    Imaging XPS - a new technique. 2 - Experimental verification (1987)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 10 (1987), S. 242-249 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The XPS image is obtained by the dissection of the surface area of interest into a series of adjacent narrow strips. The width of the entrance slit system of the energy analyzer gives the strip width and a translational movement of the specimen makes it possible to investigate the total number of strips step by step. By means of the double focusing properties of the spherical analyzer the energy spectrum from each point (spot) of the strip area under observation is available on the detector focal plane. Specific photoelectron lines are selected by a suitable choice of the sphere voltages. A position sensitive electron detector together with a computer is used to collect and store these spectra simultaneously in the course of one measurement. The net count rate is evaluated afterwards. Each spot of the strip is represented by its corresponding value of the net count rate and the series of values is stored in a computer memory. At the end of collection of all the strip information the image is put together strip by strip. To date a resolution of 0.3 mm has been realised and the time of data collection for an area of 10 × 10 mm2 is about one hour. The corresponding time of measurement with our imaging method is just a few minutes as one needs only the elemental distribution of an element along a single line as in an electron micronalyzer with a line scan.
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740100504
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    Paper (German National Licenses)
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