Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
54 (1989), S. 901-903
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The formation of an interfacial AlN layer was observed in an Al/Si3 N4 thin-film system immediately after electron beam deposition of Al, employing Auger electron spectroscopy, x-ray diffraction, and transmission electron microscopy. Heat treatments up to 600 °C resulted in growth of this layer. The Si liberated by the direct reaction between Al and Si3 N4 was found to crystallize into small islands of peculiar fractal-like shape. The AlN layer acted as a diffusion barrier for diffusion of Al into Si3 N4 .
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.101418
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