ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We present the first atomic-resolution image of a surface obtained with an optical implementation of the atomic-force microscope (AFM). The native oxide on silicon was imaged with atomic resolution, and ≈5-nm resolution images of aluminum, mechanically ground iron, and corroded stainless steel were obtained. The relative merits of an optical implementation of the AFM as opposed to a tunneling implementation are discussed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.342563
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