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  • 1
    Electronic Resource
    Electronic Resource
    An atomic-resolution atomic-force microscope implemented using an optical lever (1989)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 65 (1989), S. 164-167 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present the first atomic-resolution image of a surface obtained with an optical implementation of the atomic-force microscope (AFM). The native oxide on silicon was imaged with atomic resolution, and ≈5-nm resolution images of aluminum, mechanically ground iron, and corroded stainless steel were obtained. The relative merits of an optical implementation of the AFM as opposed to a tunneling implementation are discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.342563
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  • 2
    Electronic Resource
    Electronic Resource
    Submicron characterization of recording media using magnetic force microscopy (invited) (abstract) : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 6440-6440 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetic force microscopy is finding widespread use in the analysis of magnetic structure at length scales relevant to modern storage densities. We present a new technique which uses the extremely localized stray fields of MFM tips to probe submicron media characteristics. The tip is brought into contact with the magnetized media, and a uniform external field Hext is momentarily added to the tip's stray field. If the net field exceeds the local media coercivity, the magnetization is reversed locally, and a "bit'' is written. High-resolution MFM imaging of the results is done immediately using the same probe. Bit arrays of several Gbit/in2 can be produced with the lithography software of a commercial MFM. Using the external field Hext as a parameter, the threshold for bit writing can be determined, giving a measure of the local, or "point'', coercivity of the media on a 100 nm scale. Results for perpendicular Co–Cr and magneto-optical media can deviate significantly from conventional bulk hysteresis measurements, in some cases reversing the bulk coercivity ranking. Intermediate values of Hext reveal spatial variations in the point coercivity due to fluctuations in composition or microstructure. In square media, sufficiently strong fields Hext cause existing bits to grow, leading to bulk reversal via front propagation, and allowing a direct measurement of wall motion coercivity. Possible extensions to longitudinal media will be discussed. In general, combining the imaging and writing capabilities of MFM probes gives a direct assessment of media response to very localized fields, and leads to a powerful method for relating microstructure to bulk hysteresis properties. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361965
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  • 3
    Electronic Resource
    Electronic Resource
    A new, optical-lever based atomic force microscope (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 796-799 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new optical-lever based atomic force microscope is described in which the cantilever scans and is accurately tracked by a scanning focused spot. It can operate at forces below one nanoNewton over image areas greater than 100 μ×100 μ. It can be combined with optical microscopes of high numerical aperture and operated with the sample and cantilever in fluids. As examples of its applications, images of living cells in Petri dishes and a 6 in. (15.24 mm) silicon wafer are included.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.357751
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  • 4
    Electronic Resource
    Electronic Resource
    Short cantilevers for atomic force microscopy (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3583-3590 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have designed and tested a family of silicon nitride cantilevers ranging in length from 23 to 203 μm. For each, we measured the frequency spectrum of thermal motion in air and water. Spring constants derived from thermal motion data agreed fairly well with the added mass method; these and the resonant frequencies showed the expected increase with decreasing cantilever length. The effective cantilever density (calculated from the resonant frequencies) was 5.0 g/cm3, substantially affected by the mass of the reflective gold coating. In water, resonant frequencies were 2 to 5 times lower and damping was 9 to 24 times higher than in air. Thermal motion at the resonant frequency, a measure of noise in tapping mode atomic force microscopy, decreased about two orders of magnitude from the longest to the shortest cantilever. The advantages of the high resonant frequency and low noise of a short (30 μm) cantilever were demonstrated in tapping mode imaging of a protein sample in buffer. Low-noise images were taken with feedback at a rate of about 0.5 frames/s. Given proper setpoint adjustment, the sample was not damaged, despite this cantilever's high spring constant of 1.3 N/m. Without feedback, images were taken at 1.5 frames/s. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147177
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  • 5
    Electronic Resource
    Electronic Resource
    Near-field photolithography with a solid immersion lens (1999)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 74 (1999), S. 501-503 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have exposed 190 nm lines in photoresist by focusing a laser beam (λ=442 nm) in a solid immersion lens (SIL) that is mounted on a flexible cantilever and scanned by a modified commercial atomic force microscope. The scan rate was 1 cm/s, which is several orders of magnitude faster than typical reports of near-field lithography using tapered optical fibers. The enhanced speed is a result of the high optical efficiency (about 10−1) of the SIL. Once exposed with the SIL, the photoresist was developed and the pattern was transferred to the silicon substrate by plasma etching. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.123168
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  • 6
    Electronic Resource
    Electronic Resource
    Field-dependence of microscopic probes in magnetic force microscopy (1996)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 69 (1996), S. 705-707 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present a technique for characterizing the magnetic state of a magnetic force microscopy (MFM) probe as a function of uniform external magnetic field H. A local magnetic field is generated by micron-scale current carrying conductors and directly imaged by MFM. As H alters the magnetic state of the probe, changes in image contrast yield componentwise measures of the tip's net magnetic moment m, tip hysteresis loops and coercivities, and possible orientations (vertical vs lateral) of remanent states mr used for most MFM imaging. Results are presented for a variety of thin-film probes. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.117813
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  • 7
    Electronic Resource
    Electronic Resource
    Energy dissipation in tapping-mode atomic force microscopy (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 2613-2615 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A method is presented to measure the energy dissipated by the tip–sample interaction in tapping-mode atomic force microscopy (AFM). The results show that if the amplitude of the cantilever is held constant, the sine of the phase angle of the driven vibration is then proportional to changes in the tip–sample energy dissipation. This means that images of the cantilever phase in tapping-mode AFM are closely related to maps of dissipation. The maximum dissipation observed for a 4 N/m cantilever with an initial amplitude of 25 nm tapping on a hard substrate at 74 kHz is about 0.3 pW. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.121434
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  • 8
    Electronic Resource
    Electronic Resource
    Near-field scanning solid immersion microscope (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 2779-2781 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report a near-field scanning optical microscope using a solid immersion lens having a sharp tip that is mounted to a cantilever. The sharp tip allows the sample to enter the near field of the illumination. The cantilever provides sensitive control of forces. We describe two types of near-field optical contrast, interference and reflection, that simultaneously measure surface topography and reflectivity. Using a super-hemispherical lens with index n=2.2 and 442 nm illumination, the microscope resolves optical features smaller than 150 nm, a factor of 2 improvement over a conventional optical microscope. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.121457
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  • 9
    Electronic Resource
    Electronic Resource
    Tapping mode atomic force microscopy in liquids (1994)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 64 (1994), S. 1738-1740 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Tapping mode atomic force microscopy in liquids gives a substantial improvement in imaging quality and stability over standard contact mode. In tapping mode the probe-sample separation is modulated as the probe scans over the sample. This modulation causes the probe to tap on the surface only at the extreme of each modulation cycle and therefore minimizes frictional forces that are present when the probe is constantly in contact with the surface. This imaging mode increases resolution and reduces sample damage on soft samples. For our initial experiments we used a tapping frequency of 17 kHz to image deoxyribonucleic acid plasmids on mica in water. When we imaged the same sample region with the same cantilever, the plasmids appeared 18 nm wide in contact mode and 5 nm in tapping mode.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.111795
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  • 10
    Electronic Resource
    Electronic Resource
    Noncontact force microscopy in liquids (1993)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 63 (1993), S. 617-618 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Force microscopy in liquids offers many advantages including the mitigation of capillary forces and the simulation of real environments for biological and technological processes. Noncontact force microscopy in liquids adds the advantage of probing electrical and magnetic fields above surfaces. Here we demonstrate magnetic force imaging of recorded bits on a computer hard disk in air and in liquid. A method of noncontact force microscopy (patent pending, Digital Instruments) is used in which the tip is first scanned in contact to image topography and then rescanned above the surface to image long-range forces.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.109967
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