ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
X-ray intensity versus energy (I-E) curves were measured in order to obtain the rod profiles. The three-dimensional surface structures of Si(111) 7/8 × 7/8 -Bi and -Ag were analyzed. The adsorption sites with respect to the crystal were derived from the intensity changes along the integral-order rods especially near the Bragg points by utilizing the interference effect between the x rays diffracted from the adsorbed layer and the bulk crystal. The positions of the surface Si atoms were studied by using the interference effect between the x rays diffracted from the adsorbed layer and the surface Si layer.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1140721
Permalink