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  • 1980-1984  (1)
  • 1
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 11 (1982), S. 32-34 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A method is described for the calibration of Ar Kα counting rates, measured using crystal spectrometers equipped with Ar-flow proportional counters. Linear extrapolation from overvoltage corrected x-ray yields of the elements with Kα x-ray energies lower than those of the ArK absorption edge gives an accurate description of the experimental Ar Kα intensity ratios from counters operated at different values of gas pressure. Results of all-element film analyses provided by a matrix correction procedure, ZAF, indicate an accuracy better than 5% relative for the determination of Ar concentrations ranging from 0.1 to 10 wt%.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
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