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  • Digitale Medien  (2)
  • 07.60  (1)
  • 1-norm  (1)
  • 1
    Digitale Medien
    Digitale Medien
    Springer
    BIT 39 (1999), S. 757-779 
    ISSN: 1572-9125
    Schlagwort(e): Overdetermined linear systems ; rank reduction ; Hankel structure ; Toeplitz structure ; structured total least norm ; total least squares ; 1-norm ; 2-norm ; singular value decomposition
    Quelle: Springer Online Journal Archives 1860-2000
    Thema: Mathematik
    Notizen: Abstract The structure preserving rank reduction problem arises in many important applications. The singular value decomposition (SVD), while giving the closest low rank approximation to a given matrix in matrix L 2 norm and Frobenius norm, may not be appropriate for these applications since it does not preserve the given structure. We present a new method for structure preserving low rank approximation of a matrix, which is based on Structured Total Least Norm (STLN). The STLN is an efficient method for obtaining an approximate solution to an overdetermined linear system AX ≈ B, preserving the given linear structure in the perturbation [E F] such that (A + E)X = B + F. The approximate solution can be obtained to minimize the perturbation [E F] in the L p norm, where p = 1, 2, or ∞. An algorithm is described for Hankel structure preserving low rank approximation using STLN with L p norm. Computational results are presented, which show performances of the STLN based method for L 1 and L 2 norms for reduced rank approximation for Hankel matrices.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 2
    ISSN: 1432-0649
    Schlagwort(e): 07.60 ; 42.60 ; 07.20
    Quelle: Springer Online Journal Archives 1860-2000
    Thema: Physik
    Notizen: Abstract We have used a modified photothermal probe beam deflection system with a back pumping configuration for the measurements of the temperature-dependent thermal diffusivity of atmospheric air. The results are consistent and reasonably well agree with the literature values. The measured thermal diffusivity values are the same for the same measuring temperature regardless of the beam offsets and the deflecting surface temperatures. For the gas with known temperature-dependent thermal diffusivity, this method can be used to deduce the temperature of a gas from the measured thermal diffusivity value.
    Materialart: Digitale Medien
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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