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  • 1
    ISSN: 1572-9605
    Keywords: YBaCuO ; gamma irradiation ; critical current density ; flux pinning
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract We investigated the flux pinning behavior induced by gamma irradiation in Y1Ba2Cu3O(7−x) silver-added samples. The superconductors were prepared through solid-state route and added with silver in amounts of 0-, 6.5-, and 20-wt%, following which the samples were irradiated by high-energy gamma irradiation (γ) at doses of 0, 500, and 1500 kGy at the dosage rate of 8.2 kGy/h. We performed magnetization loops to study the flux pinning of vortex in YBCO/Ag superconductors. We found that silver addition and irradiation on superconductors may increase the width in magnetization loops, which is related to the enhancement in the critical current density, J c . We established that an interaction between silver addition and irradiation that results in higher values in J c for YBCO/Ag irradiated samples already exists. The J c in samples containing 20-wt% of silver decreased with irradiation because a higher content of silver produces small crystals and secondary phases growing. On comparing the TGA analysis for both YBCO and YBCO/Ag samples, we found higher-weight oxygen losses in YBCO silver samples, which suggests that silver increases the oxygen saturation content. The higher oxygen content found on irradiated specimens it is indicative of oxygen losses from CuO chains or CuO2 planes reached by γ-irradiation.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1059-910X
    Keywords: Reflected beam ; Amorphization ; Ion bombardment ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: In this paper we report the effect of noble gas ions bombardment on the degradation of atomically flat Si(111) surfaces at room and high (400°C - 600°C) temperatures. Reflection high energy electron diffraction (RHEED) and reflection electron microscopy (REM) have been used to characterize the topography and structure of the as-implanted and post annealed surface layers. It is shown that the fading of the specularly reflected beam is not directly related to the amorphization of the surface. This experimental study has also evidenced the difficulties one meets to regrow a defect-free material after amorphization by noble gas bombardment. For high temperature for which the amorphization is not possible, the surface loses its stepped structure and turns into a monocrystalline but atomically rough surface. This roughness is a function of substrate temperature.
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
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