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  • 1
    ISSN: 1437-1596
    Keywords: Mass disaster ; Victim identification ; Forensic odontology ; Air disaster
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine , Law
    Notes: Abstract The authors report on the contribution of odontological identification of the flight ALIT 5148 air disaster victims, which occurred on 20th January 1992. The identification procedure was difficult due to large numbers of bodies and mutilations and required the involvement of multidisciplinary teams composed of odontologists, forensic pathologists, radiologists and biologists. The authors set up a simple, discriminant classification which was easy to handle by a multidisciplinary team. Four groups were defined according to the matching characteristics between ante and post mortem data. Perfect matching characteristics between ante and post mortem data were achieved in only 44 cases (Group A). Partial matching characteristics between ante and post mortem data were achieved in 12 cases (Group B). In 29 cases, the insufficiency or absence of odontological data (Group C and D) did not enable the victim to be identified. The results of the investigations showed that the dental examination alone enabled 17 victims to be identified and by including a morphological examination the figure reached 33. By the end of the investigations, 85 of the 87 victims were positively identified. Odontological identification is an essential, accurate and rapid method with allows a body to be identified from its dental characteristics. This anthropometrical method of identification is included with the descriptive and the biological methods. The authors present their experience in performing a formal identification of 44 victims in less than 15 days.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 22 (1994), S. 372-375 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The electronic properties of amorphous and ion-implanted polycrystalline SnO2 films have been studied using x-ray photoemission spectromicroscopy. First, we analysed the degree of oxidation and the homogeneity of as-deposited films. The SnO and SnO2 phases were identified from their valence band spectra rather than from the Sn 3d core level spectra. Then we studied the damage effects due to the implantation of Pd+ and Ga+ ions in polycrystalline films. The ion bombardment of SnO2 films results in drastic changes of valence-band spectra which is correlated to compositional changes. Annealing in air at 600 °C for 4 h leads to complete recovery of radiation damage. However, after such thermal annealings, the film surface still contains a relatively high amount of SnO (5-10%).
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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