Library

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Naunyn-Schmiedeberg's archives of pharmacology 359 (1999), S. 484-492 
    ISSN: 1432-1912
    Keywords: Key words 2 ; 3-Butanedione monoxime ; Cantharidin ; Smooth muscle ; Phosphorylation ; Protein phosphatase ; Vasoregulation
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Notes: Abstract The aim of the study was to investigate the effects of the putative protein phosphatase (PP) activator 2,3-butanedione monoxime (BDM) in vascular smooth muscle. BDM concentration-dependently increased PP activity in homogenates of bovine coronary arteries and led to dephosphorylation of various smooth muscle proteins in 32P-labelled bovine aortic smooth muscle cells. In isolated bovine coronary artery rings (CARs) the effects of 10 mmol/l BDM on force of contraction (FOC) under conditions of depolarization by 75 mmol/l KCl and PP inhibition by 100 μmol/l cantharidin were investigated. At the end of contraction experiments CARs were freeze-clamped and myosin light chain (MLC20) phosphorylation was determined by two-dimensional gel electrophoresis. Pretreatment of CARs with BDM reduced KCl-induced FOC to 42 ± 4% vs. 118 ± 1% (no BDM) and cantharidin-induced FOC to 102 ± 2% vs. 120 ± 7% (no BDM) compared to a former KCl contraction (= 100%). Moreover, BDM increased the amount of unphosphorylated MLC20 up to 56 ± 2% vs. 36 ± 5% (no BDM) and 28 ± 2% vs. 21 ± 1% (no BDM), respectively, demonstrating the central role of MLC20 phosphorylation in initiating smooth muscle contraction. In KCl precontracted CARs BDM decreased FOC to 47 ± 4% vs. 100 ± 1% (no BDM) but did not affect MLC20 phosphorylation, suggesting an uncoupling of force maintenance and MLC20 phosphorylation. In contrast, BDM neither affected FOC nor MLC20 phosphorylation in CARs precontracted with cantharidin. These results strengthen the hypothesis that PP activation by BDM only occurs on the holoenzyme level, e.g. by affecting regulatory subunits.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 2
    ISSN: 0947-5117
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 3
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 21 (1994), S. 131-137 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The need for improved characterization of materials used in the fabrication of semiconductor devices has been driven by the semiconductor industry's desire to increase device densities on substrate. This need is reflected in the analytical surface science community by efforts to develop methods for detection of trace impurities on semiconductor substrates at extremely low levels. With improvements in standard techniques continually occurring, and with new methods of trace analysis always being developed, it is important to assess the relative abilities of the suite of surface analysis techniques available for materials characterization and to develop well-characterized standard samples for these comparisons. This paper reports on a collaborative effort to review the capabilities of several approaches to trace surface analysis. As a test case, Ni contamination of Si wafers in the dose range 1014-1010 cm-2 has been chosen. The emphasis of this paper will be on the capabilities of SARISA (surface analysis by resonant ionization of sputtered atoms) as an example of laser post-ionization secondary neutral mass spectrometry for the detection of contaminants in the near-surface region. Results on analyses of the same standard samples by other techniques will also be presented. These techniques include total reflection x-ray fluorescence and heavy ion backscattering spectrometry. The results of this comparison show that there are several techniques that can accurately determine metal contaminations on Si wafers in this concentration range and that the method of choice depends on other considerations, such as speed or accuracy of analysis.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...