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  • 1
    Electronic Resource
    Electronic Resource
    Preparation and characterization of MgO surfaces by reflection electron microscopy (1992)
    New York, NY [u.a.] : Wiley-Blackwell
    Microscopy Research and Technique 20 (1992), S. 426-438 
    Details
    ISSN: 1059-910X
    Keywords: Reflection high energy electron diffraction ; Surface topography ; Chemical polishing ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: We have employed several different methods to prepare (100) and (111) surfaces of MgO crystals. (100) surfaces prepared by simple cleaving give good reflection high energy electron diffraction (RHEED) patterns and surfaces with a high density of coarse steps. Chemical polishing of this surface results in a roughening of the topography whilst annealing in oxygen considerably smoothens the surfaces although they appear to be contaminated. Under certain conditions we find that the MgO crystals will cleave along the (111) plane. Both cleaved and mechanically polished (111) surfaces are atomically flat and reconstructed after oxygen annealing.
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1070200412
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Observation of microdiffraction patterns with a dedicated STEM instrument (1989)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 11 (1989), S. 143-154 
    Details
    ISSN: 0741-0581
    Keywords: Detector systems for microdiffraction ; STEM imaging ; Coherent diffraction effects ; Image reconstruction from diffraction patterns ; EELS ; SEM ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: A two-dimensional detector system, designed for the observation and recording of microdiffraction patterns formed in an HB 5 scanning transmission electron microscope (STEM) is described and discussed. Possibilities are described and demonstrated for the simultaneous or successive recording of microdiffraction patterns from regions of diameter 3 å or more, bright- or dark-field STEM images, EELS spectra, secondary electron images, and in-line holograms. Applications of the system have been made to studies of catalyst particles, reflection-mode imaging of bulk surfaces, and image reconstruction from microdiffraction patterns obtained from each point of a STEM image.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060110209
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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