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  • 1
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Microscopy Research and Technique 25 (1993), S. 341-345 
    ISSN: 1059-910X
    Keywords: Magnetic domains ; Thin films ; Iron ; Cobalt ; Scanning transmission electron microscopy ; Annular detector ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: A simplified mode of differential phase contrast Lorentz microscopy for the study of magnetic domain structures in thin films is proposed and demonstrated. This mode employs a single annular detector in a scanning transmission electron microscope rather than the specialized split detectors that have been previously used. The resulting signal is sufficiently linear with magnetic field strength to allow quantitative data to be obtained on the domain configurations and the natures of the domain walls. © 1993 Wiley-Liss, Inc.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    Electronic Resource
    Electronic Resource
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 11 (1989), S. 143-154 
    ISSN: 0741-0581
    Keywords: Detector systems for microdiffraction ; STEM imaging ; Coherent diffraction effects ; Image reconstruction from diffraction patterns ; EELS ; SEM ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: A two-dimensional detector system, designed for the observation and recording of microdiffraction patterns formed in an HB 5 scanning transmission electron microscope (STEM) is described and discussed. Possibilities are described and demonstrated for the simultaneous or successive recording of microdiffraction patterns from regions of diameter 3 å or more, bright- or dark-field STEM images, EELS spectra, secondary electron images, and in-line holograms. Applications of the system have been made to studies of catalyst particles, reflection-mode imaging of bulk surfaces, and image reconstruction from microdiffraction patterns obtained from each point of a STEM image.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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