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  • 1
    Electronic Resource
    Electronic Resource
    Preparation and characterization of MgO surfaces by reflection electron microscopy (1992)
    New York, NY [u.a.] : Wiley-Blackwell
    Microscopy Research and Technique 20 (1992), S. 426-438 
    Details
    ISSN: 1059-910X
    Keywords: Reflection high energy electron diffraction ; Surface topography ; Chemical polishing ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: We have employed several different methods to prepare (100) and (111) surfaces of MgO crystals. (100) surfaces prepared by simple cleaving give good reflection high energy electron diffraction (RHEED) patterns and surfaces with a high density of coarse steps. Chemical polishing of this surface results in a roughening of the topography whilst annealing in oxygen considerably smoothens the surfaces although they appear to be contaminated. Under certain conditions we find that the MgO crystals will cleave along the (111) plane. Both cleaved and mechanically polished (111) surfaces are atomically flat and reconstructed after oxygen annealing.
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1070200412
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Electron diffraction phenomena observed with a high resolution STEM instrument (1986)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 3 (1986), S. 25-44 
    Details
    ISSN: 0741-0581
    Keywords: Electron diffraction ; Scanning transmission electron microscopy ; Microdiffraction ; In-line holography ; Small particles ; Crystal structure ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: Because of the high brightness of the cold field emission source used in a dedicated scanning transmission electron microscopy (STEM) instrument, it is possible to focus electrons to a cross-over of width 3Å or less and, with a suitable detection system, to obtain diffraction patterns from specimen regions of this size or greater. Coherent interference effects are visible in shadow images (in-line holograms) and in convergent beam diffraction patterns. Special techniques have been developed for gathering information from the diffraction patterns for application to the study of the structures of crystal defects, crystal surfaces and small particles. Possibilities have been explored for holographic reconstruction from shadow images.
    Additional Material: 14 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060030105
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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