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  • 1
    Electronic Resource
    Electronic Resource
    Amperometric detection of electroinactive anions using conducting polymer electrodes subsequent to chromatographic separation (1997)
    Weinheim : Wiley-Blackwell
    Electroanalysis 9 (1997), S. 461-467 
    Details
    ISSN: 1040-0397
    Keywords: Amperometric detection of electroinactive anions ; Chloride-containing polypyrrole electrode ; Ion chromatography ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Notes: The use of a chloride-containing polypyrrole electrode for the amperometric detection of electroinactive anions subsequent to separation by ion chromatography in suppressed, low conductivity eluent is described. It is demonstrated that changes in selectivity can be obtained by the application of different potential waveforms and current sampling protocols. The approach described is based on the anion dependence of the oxidation/reduction kinetics of the conducting polymer film induced by the applied potential.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/elan.1140090606
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Sims image analysis of D2O migration in ZrO2 thin films (1997)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 948-951 
    Details
    ISSN: 0142-2421
    Keywords: SIMS ; thin film ; imaging ; diffusion ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The diffusion of D2O into and through oxide films on Zr—Nb alloys was investigated using secondary ion mass spectrometry (SIMS) image analysis. In preparation for this, the microscopic structures of the oxide were studied in relation to the grain structures in the underlying alloy. On alloys containing low concentrations of niobium (1-2.5 wt.%), the oxide was found to exhibit more localized growth, particularly above grain boundaries in the alloy. Such oxide regions appeared to be considerably more porous to D2O ingress. By contrast, the oxide film on the Zr 20 wt.% Nb alloy was found to be the most resistant to D2O ingress; no local regions of higher porosity could be found. © 1997 John Wiley & Sons, Ltd.
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
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    Paper (German National Licenses)
  • 3
    Electronic Resource
    Electronic Resource
    Topographic Correction of 3D SIMS Images (1997)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 788-789 
    Details
    ISSN: 0142-2421
    Keywords: SIMS ; topography ; AFM ; imaging ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: In order to provide an accurate rendition of a three-dimensional (3D) volume obtained by SIMS, it is necessary to take account of the topography of the original surface and the relative sputter rates of the different structures within the volume. We describe a method that corrects both distortions to 3D SIMS images. An atomic force microscope is used to produce a topographic images of the area analysed by SIMS, both before and after the depth profile. This information is convoluted with the 3D SIMS image to produce a correct 3D image of the changes in composition within the volume of the material. © 1997 by John Wiley & Sons, Ltd.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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    Paper (German National Licenses)
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