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  • 1
    Electronic Resource
    Electronic Resource
    High-temperature oxidation of iron covered by electroless Ni—P coating: A GDOS depth profiling study (1992)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 18 (1992), S. 691-694 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Steel samples coated by electroless nickel were annealed in air. Oxide growth kinetics and iron diffusion through the structure were investigated by glow discharge optical emission spectroscopy (GDOS) depth profiling. Protection against high-temperature oxidation was found to be given mostly by the austenitic interdiffusion layer formed at the interface between the substrate and the Ni—P film during annealing of the sample, which acts as a diffusion barrier for diffusion of iron to the surface.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740180910
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Depth profile analysis of an electrodeposited multilayer structure with non-uniform thickness distribution by glow discharge optical spectroscopy (1991)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 17 (1991), S. 641-645 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An electrodeposited multiplayer structure consisting of nine alternating layers of copper and nickel was depth profiled by glow discharge emission spectroscopy using a Grimm lamp with an anode tube of internal diameter 4 mm. Depth profiled of the non-uniform region near the sample edge are reported. Thickness inhomogeneity causes the erosion crater bottom to penetrate through individual layers obliquely, which is the reason for signal response distortion. The dependence of signal response on the thickness gradient is discussed and a formula for the thickness gradient estimation from the depth profiles is proposed.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740170905
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Depth analysis of nickel thin films on silicon by glow discharge spectroscopy: The interface region (1990)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 15 (1990), S. 775-780 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Depth profiles of nickel thin films on silicon obtained with a Grimm glow discharge lamp operating at various conditions were compared. The best conditions for the profile analysis are: high argon pressure, high discharge current and low discharge voltage. The signal response at the interface was described quantitatively using piecewise linear model functions. Influence of the discharge parameters on the signal response at the interface was discussed. Interface broadening was confirmed to be caused by the crater effect, with a non-uniform removal rate distribution across the analysed spot that does not depend on the total sputtered depth in the analysis of a homogeneous sample.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740151210
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Correcting the depth profiles broadened by the crater effect: A numerical procedure (1990)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 15 (1990), S. 791-793 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Concentration-depth profiles which are distorted by the crater effect exhibit a special relationship between the concentration vs. depth distribution and the measured signal vs. time response. This relation is given by a linear Volterra integral equation of the first kind with the kernel which can be experimentally evaluated. A numerical procedure is described for the profile correction by solving that equation, along with discussion of existence, uniqueness of the solution and convergence of the approximations to the original profile.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740151213
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    Paper (German National Licenses)
    Fulltext
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